SCOPUS 정보 검색 플랫폼

Volumn 87, Issue 22, 2005, Pages 1-3

Scanning gate microscopy investigations on an InGaAs quantum point contact

Author keywords

[No Author keywords available]

Indexed keywords

PITCH-OFF CONDITIONS; SCANNING GATE MICROSCOPY; SPINTRONICS;

IMAGE ANALYSIS; OPTICAL MICROSCOPY; QUANTUM INTERFERENCE DEVICES;

QUANTUM THEORY;

EID: 27944511848 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2136408 Document Type: Article

Times cited : (42)

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