SCOPUS 정보 검색 플랫폼

Advanced Materials

Volumn 19, Issue 17, 2007, Pages 2209-2212

Simultaneous IR material recognition and conductivity mapping by nanoscale near-field microscopy

(5) Huber, Andreas J a Kazantsev, Dmitry a,c Keilmann, Fritz a Wittborn, Jesper b Hillenbrand, Rainer a

a MAX PLANCK INSTITUTE OF BIOCHEMISTRY (Germany)

b INFINEON TECHNOLOGIES AG (Germany)

c INSTITUTE FOR THEORETICAL AND EXPERIMENTAL PHYSICS (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIELECTRIC PROPERTIES; ELECTRIC CONDUCTIVITY; IMAGE ANALYSIS; OPTICAL MICROSCOPY; PLASMONS;

AMPLITUDE SIGNAL; MATERIAL RECOGNITION; NEAR-FIELD MICROSCOPY;

OPTICAL MATERIALS;

EID: 34548651355 PISSN: 09359648 EISSN: None Source Type: Journal
DOI: 10.1002/adma.200602303 Document Type: Article

Times cited : (90)

References (41)

1
- 0035793378
- Y. Cui, C. M. Lieber, Science 2001, 291, 851.
- (2001) Science , vol.291 , pp. 851
- Cui, Y.¹ Lieber, C.M.²

2
- 0037033988
- M. S. Gudiksen, L. J. Lauhon, J. Wang, D. C. Smith, C. M. Lieber, Nature 2002, 415, 617.
- (2002) Nature , vol.415 , pp. 617
- Gudiksen, M.S.¹ Lauhon, L.J.² Wang, J.³ Smith, D.C.⁴ Lieber, C.M.⁵

3
- 10844253101
- M. Ieong, B. Doris, J. Kedzierski, K. Rim, M. Yang, Science 2004, 306, 2057.
- (2004) Science , vol.306 , pp. 2057
- Ieong, M.¹ Doris, B.² Kedzierski, J.³ Rim, K.⁴ Yang, M.⁵

4
- 33644922727
- Z. Q. Li, G. M. Wang, N. Sai, D. Moses, M. C. Martin, M. D. Ventra, A. J. Heeger, D. N. Basov, Nano Lett. 2006, 6, 224.
- (2006) Nano Lett , vol.6 , pp. 224
- Li, Z.Q.¹ Wang, G.M.² Sai, N.³ Moses, D.⁴ Martin, M.C.⁵ Ventra, M.D.⁶ Heeger, A.J.⁷ Basov, D.N.⁸

5
- 33846823034
- E. M. Vogel, Nat. Nanotech. 2007, 2, 25.
- (2007) Nat. Nanotech , vol.2 , pp. 25
- Vogel, E.M.¹

6
- 0037062964
- R. Hillenbrand, T. Taubner, F. Keilmann, Nature 2002, 418, 159.
- (2002) Nature , vol.418 , pp. 159
- Hillenbrand, R.¹ Taubner, T.² Keilmann, F.³

7
- 0037663775
- T. Taubner, R. Hillenbrand, F. Keilmann, J. Microsc. 2003, 210, 311.
- (2003) J. Microsc , vol.210 , pp. 311
- Taubner, T.¹ Hillenbrand, R.² Keilmann, F.³

8
- 0033600230
- D. A. Muller, T. Sorsch, S. Moccio, F. H. Baumann, K. Evans-Lutterodt, G. Timp, Nature 1999, 399, 758.
- (1999) Nature , vol.399 , pp. 758
- Muller, D.A.¹ Sorsch, T.² Moccio, S.³ Baumann, F.H.⁴ Evans-Lutterodt, K.⁵ Timp, G.⁶

9
- 0034229694
- P. E. Batson, IBM J. Res. Develop. 2000, 44, 477.
- (2000) IBM J. Res. Develop , vol.44 , pp. 477
- Batson, P.E.¹

10
- 32344450782
- A. J. Mardinly, in Electronic Device Failure Analysis 2005, 7, 6.
- A. J. Mardinly, in Electronic Device Failure Analysis 2005, 7, 6.

11
- 0000070441
- A. Born, R. Wiesendanger, Appl. Phys. A 1998, 66, 421.
- (1998) Appl. Phys. A , vol.66 , pp. 421
- Born, A.¹ Wiesendanger, R.²

12
- 4544380930
- T. Schweinböck, S. Schömann, D. Alvarez, M. Buzzo, W. Frammels-berger, P. Breitschopf, G. Benstetter, Microelectron. Reliab. 2004, 44, 1541.
- (2004) Microelectron. Reliab , vol.44 , pp. 1541
- Schweinböck, T.¹ Schömann, S.² Alvarez, D.³ Buzzo, M.⁴ Frammels-berger, W.⁵ Breitschopf, P.⁶ Benstetter, G.⁷

13
- 17644392579
- H. G. Frey, S. Witt, K. Felderer, R. Guckenberger, Phys. Rev. Lett. 2004, 93, 200 801.
- (2004) Phys. Rev. Lett , vol.93 , pp. 200-801
- Frey, H.G.¹ Witt, S.² Felderer, K.³ Guckenberger, R.⁴

14
- 0000274050
- R. M. Stöckle, Y. D. Suh, V. Deckert, R. Zenobi, Chem. Phys. Lett. 2000, 318, 131.
- (2000) Chem. Phys. Lett , vol.318 , pp. 131
- Stöckle, R.M.¹ Suh, Y.D.² Deckert, V.³ Zenobi, R.⁴

15
- 0037424143
- A. Hartschuh, E. J. Sanchez, X. S. Xie, L. Novotny, Phys. Rev. Lett. 2003, 90, 095 503.
- (2003) Phys. Rev. Lett , vol.90 , pp. 095-503
- Hartschuh, A.¹ Sanchez, E.J.² Xie, X.S.³ Novotny, L.⁴

16
- 0001040403
- A. Lahrech, R. Bachelot, P. Gleyzes, A. C. Boccara, Opt. Lett. 1996, 21, 1315.
- (1996) Opt. Lett , vol.21 , pp. 1315
- Lahrech, A.¹ Bachelot, R.² Gleyzes, P.³ Boccara, A.C.⁴

17
- 0031552789
- A. Lahrech, R. Bachelot, P. Gleyzes, A. C. Boccara, Appl. Phys. Lett. 1997, 71, 575.
- (1997) Appl. Phys. Lett , vol.71 , pp. 575
- Lahrech, A.¹ Bachelot, R.² Gleyzes, P.³ Boccara, A.C.⁴

18
- 0033551356
- B. Knoll, F. Keilmann, Nature 1999, 399, 134.
- (1999) Nature , vol.399 , pp. 134
- Knoll, B.¹ Keilmann, F.²

19
- 0035083657
- B. Dragnea, J. Preusser, J. M. Szarko, S. R. Leone, J. Vac. Sci. Technol. B 2001, 19, 142.
- (2001) J. Vac. Sci. Technol. B , vol.19 , pp. 142
- Dragnea, B.¹ Preusser, J.² Szarko, J.M.³ Leone, S.R.⁴

20
- 0035353377
- B. B. Akhremitchev, S. Pollack, G. C. Walker, Langmuir 2001, 17, 2774.
- (2001) Langmuir , vol.17 , pp. 2774
- Akhremitchev, B.B.¹ Pollack, S.² Walker, G.C.³

21
- 0038201852
- L. A. McDonough, B. Dragnea, J. Preusser, S. R. Leone, J. Phys. Chem. B 2003, 107, 4951.
- (2003) J. Phys. Chem. B , vol.107 , pp. 4951
- McDonough, L.A.¹ Dragnea, B.² Preusser, J.³ Leone, S.R.⁴

22
- 27144486397
- M. B. Raschke, L. Molina, T. Elsaesser, D. H. Kim, W. Knoll, K. Hinrichs, ChemPhysChem 2005, 6, 2197.
- (2005) ChemPhysChem , vol.6 , pp. 2197
- Raschke, M.B.¹ Molina, L.² Elsaesser, T.³ Kim, D.H.⁴ Knoll, W.⁵ Hinrichs, K.⁶

23
- 24644482621
- D. Vobornik, G. Margaritondo, J. S. Sanghera, P. Thielen, I. D. Aggarwal, B. Inanov, N. H. Tolk, V. Manni, S. Grimaldi, A. Lisi, S. Rieti, D. W. Piston, R. Generosi, M. Luce, P. Perfetti, A. Cricenti, J. Alloys Cmpds. 2005, 401, 80.
- (2005) J. Alloys Cmpds , vol.401 , pp. 80
- Vobornik, D.¹ Margaritondo, G.² Sanghera, J.S.³ Thielen, P.⁴ Aggarwal, I.D.⁵ Inanov, B.⁶ Tolk, N.H.⁷ Manni, V.⁸ Grimaldi, S.⁹ Lisi, A.¹⁰ Rieti, S.¹¹ Piston, D.W.¹² Generosi, R.¹³ Luce, M.¹⁴ Perfetti, P.¹⁵ Cricenti, A.¹⁶

24
- 19144364766
- T. Taubner, R. Hillenbrand, F. Keilmann, Appl. Phys. Lett. 2004, 85, 5064.
- (2004) Appl. Phys. Lett , vol.85 , pp. 5064
- Taubner, T.¹ Hillenbrand, R.² Keilmann, F.³

25
- 33646434821
- A. Huber, N. Ocelic, T. Taubner, R. Hillenbrand, Nano Lett. 2006, 6, 774.
- (2006) Nano Lett , vol.6 , pp. 774
- Huber, A.¹ Ocelic, N.² Taubner, T.³ Hillenbrand, R.⁴

26
- 4444249563
- N. Ocelic, R. Hillenbrand, Nat. Mater. 2004, 3, 606.
- (2004) Nat. Mater , vol.3 , pp. 606
- Ocelic, N.¹ Hillenbrand, R.²

27
- 0000037879
- B. Knoll, F. Keilmann, Appl. Phys. Lett. 2000, 77, 3980.
- (2000) Appl. Phys. Lett , vol.77 , pp. 3980
- Knoll, B.¹ Keilmann, F.²

28
- 33645460979
- J. Samson, G. Wollny, E. Bründermann, A. Bergner, A. Hecker, G. Schwaab, A. Wieck, M. Havenith, Phys Chem. Chem. Phys. 2006, 8, 753.
- (2006) Phys Chem. Chem. Phys , vol.8 , pp. 753
- Samson, J.¹ Wollny, G.² Bründermann, E.³ Bergner, A.⁴ Hecker, A.⁵ Schwaab, G.⁶ Wieck, A.⁷ Havenith, M.⁸

29
- 33748518192
- N. Ocelic, A. Huber, R. Hillenbrand, Appl. Phys. Lett. 2006, 89, 101 124.
- (2006) Appl. Phys. Lett , vol.89 , pp. 101-124
- Ocelic, N.¹ Huber, A.² Hillenbrand, R.³

30
- 18844482082
- R. Hillenbrand, F. Keilmann, Phys. Rev. Lett. 2000, 85, 3029.
- (2000) Phys. Rev. Lett , vol.85 , pp. 3029
- Hillenbrand, R.¹ Keilmann, F.²

31
- 79957940127
- R. Hillenbrand, F. Keilmann, Appl. Phys. Lett. 2002, 80, 25.
- (2002) Appl. Phys. Lett , vol.80 , pp. 25
- Hillenbrand, R.¹ Keilmann, F.²

32
- 3042661998
- R. Hillenbrand, Ultramicroscopy 2004, 100, 421.
- (2004) Ultramicroscopy , vol.100 , pp. 421
- Hillenbrand, R.¹

33
- 0003950343
- John Wiley and Sons, New York
- S. M. Sze, Physics of Semiconductors, John Wiley and Sons, New York 1981.
- (1981) Physics of Semiconductors
- Sze, S.M.¹

34
- 0020087475
- N. D. Arora, J. R. Hauser, D. J. Roulston, IEEE Trans. Electron Devices 1982, ED-29, 292.
- (1982) IEEE Trans. Electron Devices , vol.ED-29 , pp. 292
- Arora, N.D.¹ Hauser, J.R.² Roulston, D.J.³

35
- 0036494552
- S. Reggiani, M. Valdinoci, L. Colalongo, M. Rudan, G. Baccarani, A. D. Stricker, F. Illien, N. Felber, W. Fichtner, L. Zullino, IEEE Trans. Electron Devices 2002, 49, 490.
- (2002) IEEE Trans. Electron Devices , vol.49 , pp. 490
- Reggiani, S.¹ Valdinoci, M.² Colalongo, L.³ Rudan, M.⁴ Baccarani, G.⁵ Stricker, A.D.⁶ Illien, F.⁷ Felber, N.⁸ Fichtner, W.⁹ Zullino, L.¹⁰

36
- 34548640612
- A similar behavior is known for Lorentz oscillators, which can be understood by the specific correlation between amplitude and phase
- A similar behavior is known for Lorentz oscillators, which can be understood by the specific correlation between amplitude and phase.

37
- 0037171741
- P. M. Voyles, D. A. Muller, J. L. Grazul, P. H. Citrin, H.-J. L. Gossmann, Nature 2002, 416, 826.
- (2002) Nature , vol.416 , pp. 826
- Voyles, P.M.¹ Muller, D.A.² Grazul, J.L.³ Citrin, P.H.⁴ Gossmann, H.-J.L.⁵

38
- 0000973575
- T.-I. Jeon, D. Grischkowsky, Phys. Rev. Lett. 1997, 78, 1106.
- (1997) Phys. Rev. Lett , vol.78 , pp. 1106
- Jeon, T.-I.¹ Grischkowsky, D.²

39
- 15744400054
- J. Renger, S. Grafström, L. M. Eng, R. Hillenbrand, Phys. Rev. B 2005, 71, 75 410.
- (2005) Phys. Rev. B , vol.71 , pp. 75-410
- Renger, J.¹ Grafström, S.² Eng, L.M.³ Hillenbrand, R.⁴

40
- 33746884272
- M. Brehm, T. Taubner, R. Hillenbrand, F. Keilmann, Nano Lett. 2006, 6, 1307.
- (2006) Nano Lett , vol.6 , pp. 1307
- Brehm, M.¹ Taubner, T.² Hillenbrand, R.³ Keilmann, F.⁴

41
- 27544467838
- T. Taubner, F. Keilmann, R. Hillenbrand, Opt. Expr. 2005, 13, 8893.
- (2005) Opt. Expr , vol.13 , pp. 8893
- Taubner, T.¹ Keilmann, F.² Hillenbrand, R.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.