Three-dimensional imaging of short-range chemical forces with picometre resolution

Nature Nanotechnology

Volumn 4, Issue 5, 2009, Pages 307-310

  Albers, Boris J ^a   Schwendemann, Todd C ^a   Baykara, Mehmet Z ^a   Pilet, Nicolas ^a,b   Liebmann, Marcus ^a,c   Altman, Eric I ^a   Schwarz, Udo D ^a  

^a Yale University   (United States)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^c RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GRAPHITE;

CHEMICAL FORCES; LATERAL FORCE; LUBRICATION PROPERTY; THREE DIMENSIONAL IMAGING; THREE DIMENSIONS; THREE-DIMENSIONAL SURFACE;

FILM GROWTH;

GRAPHITE; NANOMATERIAL;

ARTICLE; ATOM; ATOMIC FORCE MICROSCOPY; CATALYSIS; FILM; FORCE; LUBRICATION; PRIORITY JOURNAL; THREE DIMENSIONAL IMAGING; CHEMISTRY; MECHANICAL STRESS; METHODOLOGY; NANOTECHNOLOGY; SENSITIVITY AND SPECIFICITY; ULTRASTRUCTURE;

GRAPHITE; IMAGING, THREE-DIMENSIONAL; MICROCHEMISTRY; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; NANOTECHNOLOGY; SENSITIVITY AND SPECIFICITY; STRESS, MECHANICAL;

EID: 67049158292     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2009.57     Document Type: Article

References (35)

1. Barker, J. A. & Auerbach, D. J. Gas-surface interactions and dynamics; thermal energy atomic and molecular beam studies. Surf. Sci. Rep. 4, 1-99 (1985).
2. Christensen, C. H. & Norskov, J. K. A molecular view of heterogeneous catalysis. J. Chem. Phys. 128, 182503 (2008).
3. Fu, Q. & Wagner, T. Interaction of nanostructured metal overlayers with oxide surfaces. Surf. Sci. Rep. 62, 431-498 (2007).
4. Hölscher, H., Schirmeisen, A. & Schwarz, U. D. Principles of atomic friction: from sticking atoms to superlubric sliding. Phil. Trans. R. Soc. A 366,1383-1404 (2008).
5. Mo, Y., Turner, K. T. & Szlufarska, I. Friction laws at the nanoscale. Nature 457, 1116-1119 (2009).
6. Mate, C. M., McClelland, G. M., Erlandsson, R. & Chiang, S. Atomic-scale friction of a tungsten tip on a graphite surface. Phys. Rev. Lett. 59, 1942-1945 (1987).
7. Schwarz, U. D., Zworner, O., Koster, P. & Wiesendanger, R. Quantitative analysis of the frictional properties of solid materials at low load. I. Carbon compounds. Phys. Rev. B 56, 6987-6996 (1997).
8. Dirnwiebel, M. et al. Superlubricityofgraphite. Phys.Rev.Lett. 92, 126101 (2004).
9. Avouris, P., Chen, Z. & Perebeinos, V. Carbon-based electronics. Nature Nanotech. 2, 605-615 (2007).
10. Meyer, J. C., Girit, C. O., Crommie, M. F. & Zettl, A. Imaging and dynamics of light atoms and molecules on graphene. Nature 454, 319-322 (2008).
11. Gomez-Navarro, C. et al. Electronic transport properties of individual chemically reduced graphene oxide sheets. Nano Lett. 7, 3499-3503 (2007).
12. Seo, Y. & Jhe, W. Atomic force microscopy and spectroscopy. Rep. Prog. Phys. 71, 016101 (2008).
13. Giessibl, F. J. Atomic resolution of the silicon (111)-(7 × 7) surface by atomic force microscopy. Science 287, 68-71 (1995).
14. Schwarz, A., Holscher, H., Langkat, S. M. & Wiesendanger, R. Three-dimensional force field spectroscopy. AIP Conf. Proc. 696, 68-78 (2003).
15. Ternes, M., Lutz, C. P., Hirjibehedin, C. F., Giessibl, F. J. & Heinrich, A. J. The force needed to move an atom. Science 319, 1066-1069 (2008).
16. Ruschmeier, K., Schirmeisen, A. & Hoffmann, R. Atomic-scale force-vector fields. Phys. Rev. Lett. 101, 156102 (2008).
17. Sugimoto, Y., Namikawa, T., Miki, K., Abe, M. & Morita, S. Vertical and lateral force mapping on the Si(111)-(7 × 7) surface by dynamic force microscopy. Phys. Rev. B 77, 195424 (2008).
18. Holscher, H., Allers, W., Schwarz, U. D., Schwarz, A. & Wiesendanger, R. Determination of tip-sample interaction potentials by dynamic force spectroscopy. Phys. Rev. Lett. 83, 4780-4783 (1999).
19. Sader, J. E. & Jarvis, S. P. Accurate formulas for interaction force and energy in frequency modulation force spectroscopy. Appl. Phys. Lett. 84,1801-1803 (2004).
20. Holscher, H., Schwarz, A., Allers, W., Schwarz, U. D. & Wiesendanger, R. Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001) in the contact and noncontact regime. Phys. Rev. B 61, 12678-12681 (2000).
21. Lantz, M. A. et al. Quantitative measurement of short-range chemical bonding forces. Science 291, 2580-2583 (2001).
22. Sugimoto, Y. et al. Chemical identification of individual surface atoms by atomic force microscopy. Nature 446, 64-67 (2007).
23. Schrimeisen, A., Weiner, D. & Fuchs, H. Single-atom contact mechanics: from atomic scale energy barrier to mechanical relaxation hysteresis. Phys. Rev. Lett. 97, 136101 (2006).
24. Heyde, M., Simon, G. H., Rust, H.-P. & Freund, H.-J. Probing adsorption sites on thin oxide films by dynamic force microscopy. Appl. Phys. Lett. 89, 263107 (2006).
25. Abe, M. et al. Drift-compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy. Appl. Phys. Lett. 90, 203103 (2007).
26. Ashino, M. et al. Atomically resolved mechanical response of individual metallofullerene molecules confined inside carbon nanotubes. Nature Nanotech. 3, 337-341 (2008).
27. Stolyarova, E. et al. High-resolution scanning tunneling microscopy imaging of mesoscopic graphene sheets on an insulating surface. Proc. Natl Acad. Sci. USA 104, 9209-9212 (2007).
28. Albers, B. J. et al. Combined low-temperature scanning tunneling/atomic force microscope for atomic-resolution imaging and site-specific force spectroscopy. Rev. Sci. Instrum. 79, 033701 (2008).
29. Holscher, H. et al. Interpretation of 'true atomic resolution' images of graphite (0001) in noncontact atomic force microscopy. Phys. Rev. B 62, 6967-6970 (2000).
30. Hembacher, S., Giessibl, F. J., Mannhart, J. & Quate, C. F. Revealing the hidden atom in graphite by low-temperature atomic force microscopy. Proc. Natl Acad. Sci. USA 100, 12539-12542 (2003).
31. Hembacher, S., Giessibl, F. J., Mannhart, J. & Quate, C. F. Local spectroscopyand atomic imaging of tunneling current, forces and dissipation on graphite. Phys. Rev. Lett. 94, 056101 (2005).
32. Ashino, M. et al. Interpretation ofthe atomic scale contrast obtained on graphite and single-walled carbon nanotubes in the dynamic mode of atomic force microscopy. Nanotechnology 16, S134-S137 (2005).
33. Ashino, M., Schwarz, A., Behnke, T. & Wiesendanger, R. Atomic-resolution dynamic force microscopy and spectroscopy of a single-walled carbon nanotube: characterization of interatomic van der Waals forces. Phys. Rev. Lett. 93, 136101 (2004).
34. Holscher, H., Schwarz, U. D., Zwörner, O. & Wiesendanger, R. Consequences of the stick-slip movement for the scanning force microscopy imaging ofgraphite. Phys. Rev. B 57, 2477-2481 (1998).
35. Sasaki, N., Kobayashi, K. & Tsukada, M. Atomic-scale friction image ofgraphite in atomic-force microscopy. Phys. Rev. B 54, 2138-2149 (1996).