Interferometric measurements of electric field-induced displacements in piezoelectric thin films

Review of Scientific Instruments

Volumn 67, Issue 5, 1996, Pages 1935-1941

  Kholkin, A L ^a   Wutchrich Ch ^a   Taylor, D V ^a   Setter, N ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5244280905     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147000     Document Type: Article

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