Strong tip effects in near-field scanning optical tomography

Journal of Applied Physics

Volumn 102, Issue 10, 2007, Pages

  Sun, Jin ^a   Carney, P Scott ^a   Schotland, John C ^a,b  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; INVERSE PROBLEMS; MATHEMATICAL MODELS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SCANNING;

INVERSE SCATTERING; SCANNING PROBES;

OPTICAL TOMOGRAPHY;

EID: 36749061400     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2812545     Document Type: Article

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