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Applied Physics Letters

Volumn 95, Issue 12, 2009, Pages

Nanoscale optical tomography using volume-scanning near-field microscopy

(4) Sun, Jin a Schotland, John C b Hillenbrand, Rainer c Carney, P Scott a

a University of Illinois at Urbana Champaign (United States)

b UNIVERSITY OF PENNSYLVANIA (United States)

c BASQUE FOUNDATION FOR SCIENCE (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

NANO SCALE; NEAR FIELD OPTICAL MICROSCOPY; SAMPLE STRUCTURE; SCANNING NEAR FIELD MICROSCOPY; SCATTERED FIELD; THREE-DIMENSIONAL STRUCTURE;

DIELECTRIC MATERIALS; OPTICAL TOMOGRAPHY;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 70349687111 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3224177 Document Type: Article

Times cited : (22)

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