Electrostatic force spectroscopy and imaging of bi wires: Spatially resolved quantum confinement

Physical Review Letters

Volumn 82, Issue 19, 1999, Pages 3887-3890

  Gekhtman, D ^a   Zhang, Z B ^a   Adderton, D ^b   Dresselhaus, M S ^a,c   Dresselhaus, G ^d  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b Digital Instruments   (United States)

^c USA   (United States)

^d MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; ELECTRONIC STRUCTURE; ELECTROSTATICS; ENERGY GAP; EXTRAPOLATION; FERMI LEVEL; MATHEMATICAL MODELS; SEMICONDUCTING BISMUTH COMPOUNDS; SPECTROSCOPIC ANALYSIS;

COULOMB REPULSION; ELECTROSTATIC FORCE GRADIENT; ELECTROSTATIC FORCE SPECTROSCOPY; QUANTUM CONFINEMENT;

SEMICONDUCTOR QUANTUM WIRES;

EID: 0032606557     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.82.3887     Document Type: Article

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