Mapping nanoscale elasticity and dissipation using dual frequency contact resonance AFM

Nanotechnology

Volumn 22, Issue 35, 2011, Pages

  Gannepalli, A ^a   Yablon, D G ^b   Tsou, A H ^b   Proksch, R ^a  

^a United States   (United States)

^b EXXONMOBIL UPSTREAM RESEARCH COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM CANTILEVERS; CONTACT RESONANCE; CONTACT STIFFNESS; DAMPED HARMONIC OSCILLATOR; DUAL FREQUENCY; ELECTROMECHANICAL COUPLING COEFFICIENTS; LOSS MODULI; MECHANICAL PARAMETERS; MODEL PARAMETERS; NANO SCALE; NANOMECHANICAL CHARACTERIZATION; QUALITY FACTORS; RESONANCE FREQUENCIES; RESONANCE TRACKING; TIP-SAMPLE CONTACT; VISCO-ELASTIC MATERIAL;

ELASTICITY; ELECTROMECHANICAL COUPLING; FERROELECTRIC MATERIALS; NANOCANTILEVERS; NATURAL FREQUENCIES;

ATOMIC FORCE MICROSCOPY;

EID: 80755131692     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/35/355705     Document Type: Article

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