Tip-enhanced fluorescence microscopy at 10 nanometer resolution

Physical Review Letters

Volumn 93, Issue 18, 2004, Pages

  Gerton, Jordan M ^a,b   Wade, Lawrence A ^a   Lessard, Guillaume A ^a   Ma, Z ^a   Quake, Stephen R ^a  

^a California Institute of Technology   (United States)

^b University of UT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE MICROSCOPY (FM); NANOMETERS; SILICON TIPS; SPATIAL RESOLUTION;

ATOMIC FORCE MICROSCOPY; FREQUENCIES; IMAGE PROCESSING; LASER PULSES; NANOSTRUCTURED MATERIALS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OSCILLATIONS; PARAMETER ESTIMATION; SEMICONDUCTOR QUANTUM DOTS; SIGNAL PROCESSING; SILICON;

FLUORESCENCE;

NANOMATERIAL; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; FLUORESCENCE MICROSCOPY; LASER; METHODOLOGY; SEMICONDUCTOR;

LASERS; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, FLUORESCENCE; NANOSTRUCTURES; SEMICONDUCTORS; SILICON;

EID: 84862476813     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.93.180801     Document Type: Article

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