Quantitative Impedance measurement using atomic force microscopy

Journal of Applied Physics

Volumn 96, Issue 6, 2004, Pages 3540-3549

  O'Hayre, Ryan ^a   Feng, Gang ^a   Nix, William D ^a   Prinz, Fritz B ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOINDENTATION; QUANTITATIVE IMPEDANCE MEASUREMENTS; SCANNING CAPACITANCE MICROSCOPY; SCANNING PROBE MICROSCOPY;

ATOMIC FORCE MICROSCOPY; CAPACITANCE; ELASTIC MODULI; ELECTRIC CONDUCTIVITY; ELECTRIC IMPEDANCE; ELECTRIC RESISTANCE; ELECTROCHEMISTRY; HARDNESS; INTERFACES (MATERIALS); MEASUREMENT THEORY; NANOTECHNOLOGY; OXYGEN; PLATINUM; PRESSURE EFFECTS; REDOX REACTIONS; REDUCTION;

MATERIALS SCIENCE;

EID: 4944260386     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1778217     Document Type: Article

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