Local behavior of complex materials: Scanning probes and nano structure

Current Opinion in Solid State and Materials Science

Volumn 7, Issue 2, 2003, Pages 161-171

  Bonnell, Dawn A ^a   Shao, Rui ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

Complex materials; Multiple modulation; Relaxation; Scanning probe microscopy; Spatial resolution

Indexed keywords

CAPACITANCE; CARBON NANOTUBES; ELECTRIC IMPEDANCE; MONOLAYERS; PERMITTIVITY; SCANNING; THIN FILMS;

COMPLEX MATERIALS;

NANOSTRUCTURED MATERIALS;

NANOSTRUCTURE;

EID: 0142010419     PISSN: 13590286     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-0286(03)00047-0     Document Type: Article

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