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Volumn 91, Issue 9, 2007, Pages

Dynamic force spectroscopy using cantilever higher flexural modes

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; EIGENVALUES AND EIGENFUNCTIONS; FREQUENCY SHIFT KEYING; SIGNAL TO NOISE RATIO; SPECTROSCOPIC ANALYSIS; STIFFNESS;

EID: 34548455960     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2775806     Document Type: Article
Times cited : (45)

References (27)
  • 2
    • 0003442771 scopus 로고    scopus 로고
    • edited by S.Morita, R.Wiesendanger, and E.Meyer (Springer, Berlin
    • Noncontact Atomic Force Microscopy, edited by, S. Morita, R. Wiesendanger, and, E. Meyer, (Springer, Berlin, 2002).
    • (2002) Noncontact Atomic Force Microscopy
  • 22
    • 34548440925 scopus 로고    scopus 로고
    • Arvind Raman (private communication).
    • Arvind, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.