Measurement of three-dimensional force fields with atomic resolution using dynamic force spectroscopy

Applied Physics Letters

Volumn 81, Issue 23, 2002, Pages 4428-4430

  Holscher H ^a   Langkat, S M ^b   Schwarz, A ^b   Wiesendanger, R ^b  

^a CENTER OF ADVANCED EUROPEAN STUDIES AND RESEARCH CAESAR   (Germany)

^b UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LATTICE CONSTANTS; NICKEL; SINGLE CRYSTALS; ULTRAHIGH VACUUM;

ATOMIC RESOLUTION; DYNAMIC FORCE SPECTROSCOPY (DFS);

ATOMIC PHYSICS;

EID: 0037011628     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1525056     Document Type: Article

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