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Volumn 75, Issue 3, 2003, Pages 949-983

Advances in atomic force microscopy

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EID: 0141990921     PISSN: 00346861     EISSN: None     Source Type: Journal    
DOI: 10.1103/RevModPhys.75.949     Document Type: Review
Times cited : (1813)

References (214)
  • 1
    • 0033751178 scopus 로고    scopus 로고
    • Molecular dynamics simulations of dynamic force microscopy: Application to the Si(111)-7×7 surface
    • Abdurixit, A., A. Baratoff, and E. Meyer, 1999, "Molecular dynamics simulations of dynamic force microscopy: application to the Si(111)-7×7 surface," Appl. Surf. Sci. 157, 355-360.
    • (1999) Appl. Surf. Sci. , vol.157 , pp. 355-360
    • Abdurixit, A.1    Baratoff, A.2    Meyer, E.3
  • 3
    • 21544458820 scopus 로고
    • Improved atomic force microscopy images using cantilevers with sharp tips
    • Akamine, S., R. C. Barrett, and C. F. Quate, 1990, "Improved atomic force microscopy images using cantilevers with sharp tips," Appl. Phys. Lett. 57, 316-318.
    • (1990) Appl. Phys. Lett. , vol.57 , pp. 316-318
    • Akamine, S.1    Barrett, R.C.2    Quate, C.F.3
  • 4
    • 0141902610 scopus 로고    scopus 로고
    • private communication
    • Albrecht, T. R., 2000, private communication.
    • (2000)
    • Albrecht, T.R.1
  • 5
    • 77952760920 scopus 로고
    • Microfabrication of cantilever styli for the atomic force microscope
    • Albrecht, T. R., S. Akamine, T. E. Carver, and C. F. Quate, 1990, "Microfabrication of cantilever styli for the atomic force microscope," J. Vac. Sci. Technol. A 8, 3386-3396.
    • (1990) J. Vac. Sci. Technol. A , vol.8 , pp. 3386-3396
    • Albrecht, T.R.1    Akamine, S.2    Carver, T.E.3    Quate, C.F.4
  • 6
    • 0038981463 scopus 로고
    • Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity
    • Albrecht, T. R., P. Grutter, H. K. Horne, and D. Rugar, 1991, "Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity," J. Appl. Phys, 69, 668-673.
    • (1991) J. Appl. Phys , vol.69 , pp. 668-673
    • Albrecht, T.R.1    Grutter, P.2    Horne, H.K.3    Rugar, D.4
  • 7
    • 0141902608 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 14
    • Allers, W., A. Schwarz, and U. D. Schwarz, 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 14, pp. 233-256.
    • (2002) Noncontact Atomic Force Microscopy , pp. 233-256
    • Allers, W.1    Schwarz, A.2    Schwarz, U.D.3
  • 8
    • 0000635173 scopus 로고    scopus 로고
    • Dynamic scanning force microscopy at low temperatures on a van der Waals surface: Graphite (0001)
    • Allers, W., A. Schwarz, U. D. Schwarz, and R. Wiesendanger, 1999a, "Dynamic scanning force microscopy at low temperatures on a van der Waals surface: graphite (0001)," Appl. Surf. Sci. 140, 247-252.
    • (1999) Appl. Surf. Sci. , vol.140 , pp. 247-252
    • Allers, W.1    Schwarz, A.2    Schwarz, U.D.3    Wiesendanger, R.4
  • 9
    • 0002231718 scopus 로고    scopus 로고
    • A scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperatures
    • Allers, W., U. D. Schwarz, A. Schwarz, and R. Wiesendanger, 1998, "A scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperatures," Rev. Sci. Instrum. 69, 221-225.
    • (1998) Rev. Sci. Instrum. , vol.69 , pp. 221-225
    • Allers, W.1    Schwarz, U.D.2    Schwarz, A.3    Wiesendanger, R.4
  • 10
    • 0033216544 scopus 로고    scopus 로고
    • Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: Atomic resolution on the xenon [111] surface
    • Allers, W., U. D. Schwarz, A. Schwarz, and R. Wiesendanger, 1999b, "Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: Atomic resolution on the xenon [111] surface," Europhys. Lett. 48, 276-279.
    • (1999) Europhys. Lett. , vol.48 , pp. 276-279
    • Allers, W.1    Schwarz, U.D.2    Schwarz, A.3    Wiesendanger, R.4
  • 12
    • 0001551895 scopus 로고    scopus 로고
    • Cantilever dynamics in quasinpncontact force microscopy: Spectroscopic aspects
    • Anczykowski, B., D. Krüger, and H. Fuchs, 1996, "Cantilever dynamics in quasinpncontact force microscopy: Spectroscopic aspects," Phys. Rev. B 53, 15 485-15 488.
    • (1996) Phys. Rev. B , vol.53 , pp. 15485-15488
    • Anczykowski, B.1    Krüger, D.2    Fuchs, H.3
  • 13
    • 0141937020 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 4
    • Arai, T., and M. Tomitori, 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 4, pp. 79-92.
    • (2002) Noncontact Atomic Force Microscopy , pp. 79-92
    • Arai, T.1    Tomitori, M.2
  • 18
    • 0141971760 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 8
    • Barth, C., and M. Reichling, 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 8, 135-146.
    • (2002) Noncontact Atomic Force Microscopy , pp. 135-146
    • Barth, C.1    Reichling, M.2
  • 21
    • 0000363781 scopus 로고    scopus 로고
    • Environment-dependent interatomic potential for bulk silicon
    • Bazant, M. Z., and E. Kaxiras, 1997, "Environment-dependent interatomic potential for bulk silicon," Phys. Rev. B 56, 8542-8552.
    • (1997) Phys. Rev. B , vol.56 , pp. 8542-8552
    • Bazant, M.Z.1    Kaxiras, E.2
  • 23
    • 0141937019 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 5
    • Bennewitz, R., M. Bammerlin, and E. Meyer, 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 5, pp. 93-108.
    • (2002) Noncontact Atomic Force Microscopy , pp. 93-108
    • Bennewitz, R.1    Bammerlin, M.2    Meyer, E.3
  • 24
    • 0034165348 scopus 로고    scopus 로고
    • Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy, Pontresina, Switzerland, September 1-4, 1999
    • Bennewitz, R., C. Gerber, and E. Meyer, 2000, in "Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy, Pontresina, Switzerland, September 1-4, 1999," Appl. Surf. Sci. 157, 207-428.
    • (2000) Appl. Surf. Sci. , vol.157 , pp. 207-428
    • Bennewitz, R.1    Gerber, C.2    Meyer, E.3
  • 26
    • 0033359979 scopus 로고    scopus 로고
    • A simplified but intuitive analytical model for intermittent-contact mode force microscopy based on Hertzian mechanics
    • Bielefeldt, H., and F. J. Giessibl, 1999, "A simplified but intuitive analytical model for intermittent-contact mode force microscopy based on Hertzian mechanics," Surf. Sci. 440, L863-L867.
    • (1999) Surf. Sci. , vol.440
    • Bielefeldt, H.1    Giessibl, F.J.2
  • 28
    • 0026898391 scopus 로고
    • Force microscopy
    • Binnig, G., 1992, "Force microscopy," Ultramicroscopy 42-44, 7-15.
    • (1992) Ultramicroscopy , vol.42-44 , pp. 7-15
    • Binnig, G.1
  • 31
    • 0022107549 scopus 로고
    • The scanning tunneling microscope
    • Binnig, G., and H. Rohrer, 1985, "The scanning tunneling microscope," Sci. Am. 253 (2), 40-46.
    • (1985) Sci. Am. , vol.253 , Issue.2 , pp. 40-46
    • Binnig, G.1    Rohrer, H.2
  • 32
    • 35949012856 scopus 로고
    • Nobel Lecture: Scanning tunneling microscopy-from birth to adolescence
    • Binnig, G., and H. Rohrer, 1987, "Nobel Lecture: Scanning tunneling microscopy-from birth to adolescence," Rev. Mod. Phys. 59, 615-625.
    • (1987) Rev. Mod. Phys. , vol.59 , pp. 615-625
    • Binnig, G.1    Rohrer, H.2
  • 34
    • 34848919386 scopus 로고
    • Surface studies by scanning tunneling microscopy
    • Binnig, G., H. Rohrer, C. Gerber, and E. Weibel, 1982, "Surface studies by scanning tunneling microscopy," Phys. Rev. Lett. 49, 57-61.
    • (1982) Phys. Rev. Lett. , vol.49 , pp. 57-61
    • Binnig, G.1    Rohrer, H.2    Gerber, C.3    Weibel, E.4
  • 35
    • 19044362545 scopus 로고
    • 7×7 reconstruction on Si(111) resolved in real space
    • Binnig, G., H. Rohrer, C. Gerber, and E. Weibel, 1983, "7×7 reconstruction on Si(111) resolved in real space," Phys. Rev. Lett. 50, 120-123.
    • (1983) Phys. Rev. Lett. , vol.50 , pp. 120-123
    • Binnig, G.1    Rohrer, H.2    Gerber, C.3    Weibel, E.4
  • 36
    • 84927762517 scopus 로고
    • Measuring the nanomechanical and surface forces of materials using an atomic force microscope
    • Burnham, N., and R. J. Colton, 1989, "Measuring the nanomechanical and surface forces of materials using an atomic force microscope," J. Vac. Sci. Technol. A 7, 2906-2913.
    • (1989) J. Vac. Sci. Technol. A , vol.7 , pp. 2906-2913
    • Burnham, N.1    Colton, R.J.2
  • 38
    • 0000806979 scopus 로고
    • Tip-sample interaction effects in scanning-tunneling and atomic-force microscopy
    • Ciraci, S., A. Baratoff, and I. P. Batra, 1990, "Tip-sample interaction effects in scanning-tunneling and atomic-force microscopy," Phys. Rev. B 41, 2763-2775.
    • (1990) Phys. Rev. B , vol.41 , pp. 2763-2775
    • Ciraci, S.1    Baratoff, A.2    Batra, I.P.3
  • 40
    • 0039809542 scopus 로고
    • Confinement of electrons to quantum corrals on a metal surface
    • Crommie, M. F., C. P. Lutz, and D. M. Eigler, 1993, "Confinement of electrons to quantum corrals on a metal surface," Science 262, 218-220.
    • (1993) Science , vol.262 , pp. 218-220
    • Crommie, M.F.1    Lutz, C.P.2    Eigler, D.M.3
  • 41
    • 0035970809 scopus 로고    scopus 로고
    • Atomic force microscopy: You may squeeze the atoms but don't mangle the surface
    • de Lozanne, A., 2001, "Atomic force microscopy: You may squeeze the atoms but don't mangle the surface!" Science 291, 2561-2562.
    • (2001) Science , vol.291 , pp. 2561-2562
    • De Lozanne, A.1
  • 42
    • 21544461423 scopus 로고
    • Local electrical dissipation imaged by scanning force microscopy
    • Denk, W., and D. W. Pohl, 1991, "Local electrical dissipation imaged by scanning force microscopy," Appl. Phys. Lett. 59, 2171-2173.
    • (1991) Appl. Phys. Lett. , vol.59 , pp. 2171-2173
    • Denk, W.1    Pohl, D.W.2
  • 43
    • 0035056255 scopus 로고    scopus 로고
    • Theoretical modelling of scanning tunneling microscopy, scanning tunneling spectroscopy and atomic force microscopy
    • Drakova, D., 2001, "Theoretical modelling of scanning tunneling microscopy, scanning tunneling spectroscopy and atomic force microscopy," Rep. Prog. Phys. 64, 205-290.
    • (2001) Rep. Prog. Phys. , vol.64 , pp. 205-290
    • Drakova, D.1
  • 44
    • 0038826836 scopus 로고    scopus 로고
    • Conservative and dissipative interactions in dynamic force microscopy
    • Dürig, U., 1999a, "Conservative and dissipative interactions in dynamic force microscopy," Surf. Interface Anal. 27, 467-473.
    • (1999) Surf. Interface Anal. , vol.27 , pp. 467-473
    • Dürig, U.1
  • 45
    • 0043028832 scopus 로고    scopus 로고
    • Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy
    • Dürig, U., 1999b, "Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy," Appl. Phys. Lett. 75, 433-435.
    • (1999) Appl. Phys. Lett. , vol.75 , pp. 433-435
    • Dürig, U.1
  • 46
    • 2342503589 scopus 로고    scopus 로고
    • Interaction sensing in dynamic force microscopy
    • Dürig, U., 2000, "Interaction sensing in dynamic force microscopy," New J. Phys. 2, 5.1-5.12.
    • (2000) New J. Phys. , vol.2 , pp. 51-512
    • Dürig, U.1
  • 47
    • 35949016227 scopus 로고
    • Experimental observation of forces acting during scanning tunneling microscopy
    • Dürig, U., J. K. Gimzewski, and D. W. Pohl, 1986, "Experimental observation of forces acting during scanning tunneling microscopy," Phys. Rev. Lett. 57, 2403-2406.
    • (1986) Phys. Rev. Lett. , vol.57 , pp. 2403-2406
    • Dürig, U.1    Gimzewski, J.K.2    Pohl, D.W.3
  • 48
    • 0001449149 scopus 로고    scopus 로고
    • Dynamic force microscopy by means of the phase-controlled oscillator method
    • Dürig, U., H. P. Steinauer, and N. Blanc, 1997, "Dynamic force microscopy by means of the phase-controlled oscillator method," J. Appl. Phys. 82, 3641-3651.
    • (1997) J. Appl. Phys. , vol.82 , pp. 3641-3651
    • Dürig, U.1    Steinauer, H.P.2    Blanc, N.3
  • 49
    • 3343009894 scopus 로고
    • Observation of metallic adhesion using the scanning tunneling microscope
    • Dürig, U., O. Züger, and D. W. Pohl, 1990, "Observation of metallic adhesion using the scanning tunneling microscope," Phys. Rev. Lett. 65, 349-352.
    • (1990) Phys. Rev. Lett. , vol.65 , pp. 349-352
    • Dürig, U.1    Züger, O.2    Pohl, D.W.3
  • 50
    • 36449005197 scopus 로고
    • Interaction force detection in scanning probe microscopy: Methods and applications
    • Dürig, U., O. Züger, and A. Stalder, 1992, "Interaction force detection in scanning probe microscopy: Methods and applications," J. Appl. Phys. 72, 1778-1798.
    • (1992) J. Appl. Phys. , vol.72 , pp. 1778-1798
    • Dürig, U.1    Züger, O.2    Stalder, A.3
  • 51
    • 0000650299 scopus 로고    scopus 로고
    • Fast, high resolution atomic force microscopy using a quartz tuning fork as actuator and sensor
    • Edwards, H., L. Taylor, and W. Duncan, 1997, "Fast, high resolution atomic force microscopy using a quartz tuning fork as actuator and sensor, " J. Appl. Phys. 82, 980-984.
    • (1997) J. Appl. Phys. , vol.82 , pp. 980-984
    • Edwards, H.1    Taylor, L.2    Duncan, W.3
  • 52
    • 4244094247 scopus 로고    scopus 로고
    • High-resolution atomic force microscopic imaging of the Si(111)(7×7) surface: Contribution of short-range force to the images
    • Eguchi, T., and Y. Hasegawa, 2002, "High-resolution atomic force microscopic imaging of the Si(111)(7×7) surface: Contribution of short-range force to the images," Phys. Rev. Lett. 89, 266105.
    • (2002) Phys. Rev. Lett. , vol.89 , pp. 266105
    • Eguchi, T.1    Hasegawa, Y.2
  • 53
    • 0012064449 scopus 로고
    • Positioning single atoms with a scanning tunnelling microscope
    • Eigler, D. M., and E. K. Schweizer, 1990, "Positioning single atoms with a scanning tunnelling microscope," Nature (London) 344, 524-526.
    • (1990) Nature (London) , vol.344 , pp. 524-526
    • Eigler, D.M.1    Schweizer, E.K.2
  • 54
    • 0001261014 scopus 로고    scopus 로고
    • Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)(7×7)
    • Erlandsson, R., L. Olsson, and P. Martensson, 1997, "Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)(7×7)," Phys. Rev. B 54, R8309-R8312.
    • (1997) Phys. Rev. B , vol.54
    • Erlandsson, R.1    Olsson, L.2    Martensson, P.3
  • 56
    • 0034274898 scopus 로고    scopus 로고
    • Origins and applications of London dispersion forces and Hamaker constants in ceramics
    • French, R. H., 2000, "Origins and applications of London dispersion forces and Hamaker constants in ceramics," J. Am. Ceram. Soc. 83, 2117-2146.
    • (2000) J. Am. Ceram. Soc. , vol.83 , pp. 2117-2146
    • French, R.H.1
  • 57
    • 0141902607 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 10
    • Fukui, K., and Y. Iwasawa, 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 10, pp. 167-182.
    • (2002) Noncontact Atomic Force Microscopy , pp. 167-182
    • Fukui, K.1    Iwasawa, Y.2
  • 58
  • 59
    • 0036712485 scopus 로고    scopus 로고
    • Dynamic atomic force microscopy methods
    • Garcia, R., and R. Perez, 2002, "Dynamic atomic force microscopy methods," Surf. Sci. Rep. 47, 197-301.
    • (2002) Surf. Sci. Rep. , vol.47 , pp. 197-301
    • Garcia, R.1    Perez, R.2
  • 60
    • 0141971756 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 19
    • Gauthier, M., L. Kantorovich, and M. Tsukada, 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 19, pp. 371-394.
    • (2002) Noncontact Atomic Force Microscopy , pp. 371-394
    • Gauthier, M.1    Kantorovich, L.2    Tsukada, M.3
  • 61
    • 45849155353 scopus 로고    scopus 로고
    • Interplay between nonlinearity, scan speed, damping, and electronics in frequency modulation atomic-force microscopy
    • Gauthier, M., R. Perez, T. Arai, M. Tomitori, and M. Tsukada, 2002, "Interplay between nonlinearity, scan speed, damping, and electronics in frequency modulation atomic-force microscopy," Phys. Rev. Lett. 89, 146104.
    • (2002) Phys. Rev. Lett. , vol.89 , pp. 146104
    • Gauthier, M.1    Perez, R.2    Arai, T.3    Tomitori, M.4    Tsukada, M.5
  • 62
    • 0035880840 scopus 로고    scopus 로고
    • Dynamics of the cantilever in noncontact dynamic force microscopy: The steady-state approximation and beyond
    • Gauthier, M., N. Sasaki, and M. Tsukada, 2001, "Dynamics of the cantilever in noncontact dynamic force microscopy: The steady-state approximation and beyond," Phys. Rev. B 64, 085409.
    • (2001) Phys. Rev. B , vol.64 , pp. 085409
    • Gauthier, M.1    Sasaki, N.2    Tsukada, M.3
  • 63
    • 0001449944 scopus 로고    scopus 로고
    • Theory of noncontact dissipation force microscopy
    • Gauthier, M., and M. Tsukada, 1999, "Theory of noncontact dissipation force microscopy," Phys. Rev. B 60, 11716-11 722.
    • (1999) Phys. Rev. B , vol.60 , pp. 11716-11722
    • Gauthier, M.1    Tsukada, M.2
  • 65
    • 0005891295 scopus 로고
    • Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopy
    • Giessibl, F. J., 1992, "Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopy," Phys. Rev. B 45, 13 815-13 818.
    • (1992) Phys. Rev. B , vol.45 , pp. 13815-13818
    • Giessibl, F.J.1
  • 66
    • 0028443975 scopus 로고
    • Atomic force microscopy in ultrahigh vacuum
    • Giessibl, F. J., 1994, "Atomic force microscopy in ultrahigh vacuum," Jpn. J. Appl. Phys., Part 1 33, 3726-3734.
    • (1994) Jpn. J. Appl. Phys., Part 1 , vol.33 , pp. 3726-3734
    • Giessibl, F.J.1
  • 67
    • 0029637281 scopus 로고
    • Atomic resolution of the silicon (111)-(7×7) surface by atomic force microscopy
    • Giessibl, F. J., 1995, "Atomic resolution of the silicon (111)-(7×7) surface by atomic force microscopy," Science 267, 68-71.
    • (1995) Science , vol.267 , pp. 68-71
    • Giessibl, F.J.1
  • 69
    • 0000428132 scopus 로고    scopus 로고
    • Forces and frequency shifts in atomic resolution dynamic force microscopy
    • Giessibl, F. J., 1997, "Forces and frequency shifts in atomic resolution dynamic force microscopy," Phys. Rev. B 56, 16010-16015.
    • (1997) Phys. Rev. B , vol.56 , pp. 16010-16015
    • Giessibl, F.J.1
  • 70
    • 21944434990 scopus 로고    scopus 로고
    • High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
    • Giessibl, F. J.,1998, "High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork," Appl. Phys. Lett. 73, 3956-3958.
    • (1998) Appl. Phys. Lett. , vol.73 , pp. 3956-3958
    • Giessibl, F.J.1
  • 71
    • 0001641601 scopus 로고    scopus 로고
    • Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
    • Giessibl, F. J., 2000, "Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork," Appl. Phys. Lett. 76, 1470-1472.
    • (2000) Appl. Phys. Lett. , vol.76 , pp. 1470-1472
    • Giessibl, F.J.1
  • 72
    • 0001071771 scopus 로고    scopus 로고
    • A direct method to calculate tip-sample forces from frequency shifts in frequency-modulation atomic force microscopy
    • Giessibl, F. J., 2001, "A direct method to calculate tip-sample forces from frequency shifts in frequency-modulation atomic force microscopy," Appl. Phys. Lett. 78, 123-125.
    • (2001) Appl. Phys. Lett. , vol.78 , pp. 123-125
    • Giessibl, F.J.1
  • 73
    • 0141937017 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 2
    • Giessibl, F. J., 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 2, pp. 11-46.
    • (2002) Noncontact Atomic Force Microscopy , pp. 11-46
    • Giessibl, F.J.1
  • 74
    • 0000400209 scopus 로고    scopus 로고
    • Physical interpretation of frequency-modulation atomic force microscopy
    • Giessibl, F. J., and H. Bielefeldt, 2000, "Physical interpretation of frequency-modulation atomic force microscopy," Phys. Rev. B 61, 9968-9971.
    • (2000) Phys. Rev. B , vol.61 , pp. 9968-9971
    • Giessibl, F.J.1    Bielefeldt, H.2
  • 75
    • 0001449391 scopus 로고    scopus 로고
    • Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy
    • Giessibl, F. J., H. Bielefeldt, S. Hembacher, and J. Mannhart, 1999, "Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy," Appl. Surf. Sci. 140, 352-357.
    • (1999) Appl. Surf. Sci. , vol.140 , pp. 352-357
    • Giessibl, F.J.1    Bielefeldt, H.2    Hembacher, S.3    Mannhart, J.4
  • 76
    • 0035202491 scopus 로고    scopus 로고
    • Imaging of atomic orbitals with the atomic force microscope-experiments and simulations
    • Giessibl, F. J., H. Bielefeldt, S. Hembacher, and J. Mannhart, 2001, "Imaging of atomic orbitals with the atomic force microscope-experiments and simulations," Ann. Phys. (Leipzig) 10, 887-910.
    • (2001) Ann. Phys. (Leipzig) , vol.10 , pp. 887-910
    • Giessibl, F.J.1    Bielefeldt, H.2    Hembacher, S.3    Mannhart, J.4
  • 78
    • 0026896887 scopus 로고
    • True atomic resolution on KBr with a low-temperature atomic force microscope in ultrahigh vacuum
    • Giessibl, F. J., and G. Binnig, 1992b, "True atomic resolution on KBr with a low-temperature atomic force microscope in ultrahigh vacuum," Ultramicroscopy 42-44, 281-286.
    • (1992) Ultramicroscopy , vol.42-44 , pp. 281-286
    • Giessibl, F.J.1    Binnig, G.2
  • 79
    • 0000272316 scopus 로고
    • A low-temperature atomic force/scanning tunneling microscope for ultrahigh vacuum
    • Giessibl, F., C. Gerber, and G. Binnig, 1991, "A low-temperature atomic force/scanning tunneling microscope for ultrahigh vacuum," J. Vac. Sci. Technol. B 9, 984-988.
    • (1991) J. Vac. Sci. Technol. B , vol.9 , pp. 984-988
    • Giessibl, F.1    Gerber, C.2    Binnig, G.3
  • 80
    • 0034698297 scopus 로고    scopus 로고
    • Subatomic features on the silicon (111)-(7×7) surface observed by atomic force microscopy
    • Giessibl, F. J., S. Hembacher, H. Bielefeldt, and J. Mannhart, 2000, "Subatomic features on the silicon (111)-(7×7) surface observed by atomic force microscopy," Science 289, 422-425.
    • (2000) Science , vol.289 , pp. 422-425
    • Giessibl, F.J.1    Hembacher, S.2    Bielefeldt, H.3    Mannhart, J.4
  • 81
    • 0005275717 scopus 로고    scopus 로고
    • Response to technical comment: Subatomic features in atomic force microscopy images
    • Giessibl, F. J., S. Hembacher, H. Bielefeldt, and J. Mannhart, 2001a, "Response to technical comment: Subatomic features in atomic force microscopy images," Science 291, 2509a.
    • (2001) Science , vol.291
    • Giessibl, F.J.1    Hembacher, S.2    Bielefeldt, H.3    Mannhart, J.4
  • 84
    • 0001531020 scopus 로고    scopus 로고
    • Self oscillating mode for frequency modulation non-contact atomic force microscopy
    • Giessibl, F. J., and M. Tortonese, 1997, "Self oscillating mode for frequency modulation non-contact atomic force microscopy," Appl. Phys. Lett. 70, 2529-2531.
    • (1997) Appl. Phys. Lett. , vol.70 , pp. 2529-2531
    • Giessibl, F.J.1    Tortonese, M.2
  • 85
    • 0000098326 scopus 로고
    • Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum
    • Giessibl, F. J., and B. M. Trafas, 1994, "Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum," Rev. Sci. Instrum. 65, 1923-1929.
    • (1994) Rev. Sci. Instrum. , vol.65 , pp. 1923-1929
    • Giessibl, F.J.1    Trafas, B.M.2
  • 88
    • 0031640234 scopus 로고    scopus 로고
    • Molecular resolution of an organic monolayer by dynamic AFM
    • Gotsmann, B., C. Schmidt, C. Seidel, and H. Fuchs, 1998, "Molecular resolution of an organic monolayer by dynamic AFM," Eur. Phys. J. B 4, 267-268.
    • (1998) Eur. Phys. J. B , vol.4 , pp. 267-268
    • Gotsmann, B.1    Schmidt, C.2    Seidel, C.3    Fuchs, H.4
  • 89
    • 0001248862 scopus 로고    scopus 로고
    • Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves
    • Gotsmann, B., C. Schmidt, C. Seidel, and H. Fuchs, 1999, "Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves," Appl. Surf. Sci. 140, 314-319.
    • (1999) Appl. Surf. Sci. , vol.140 , pp. 314-319
    • Gotsmann, B.1    Schmidt, C.2    Seidel, C.3    Fuchs, H.4
  • 92
    • 0039588422 scopus 로고    scopus 로고
    • Simultaneous imaging of Si(111)7×7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode
    • Güthner, P., 1996, "Simultaneous imaging of Si(111)7×7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode," J. Vac. Sci. Technol. B 14, 2428-2431.
    • (1996) J. Vac. Sci. Technol. B , vol.14 , pp. 2428-2431
    • Güthner, P.1
  • 94
    • 0043116551 scopus 로고
    • The London-van der Waals attraction between spherical particles
    • Hamaker, H. C., 1937, "The London-van der Waals attraction between spherical particles," Physica (Amsterdam) 4, 1058-1072.
    • (1937) Physica (Amsterdam) , vol.4 , pp. 1058-1072
    • Hamaker, H.C.1
  • 95
    • 0000661712 scopus 로고
    • Theory of van der Waals microscopy
    • Hartmann, U., 1991, "Theory of van der Waals microscopy," J. Vac. Sci. Technol. B 9, 465-469.
    • (1991) J. Vac. Sci. Technol. B , vol.9 , pp. 465-469
    • Hartmann, U.1
  • 96
    • 0037187207 scopus 로고    scopus 로고
    • Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultra-high vacuum
    • Hembacher, S., F. J. Giessibl, and J. Mannhart, 2002, "Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultra-high vacuum," Appl. Surf. Sci. 188, 445-449.
    • (2002) Appl. Surf. Sci. , vol.188 , pp. 445-449
    • Hembacher, S.1    Giessibl, F.J.2    Mannhart, J.3
  • 97
    • 0041336923 scopus 로고    scopus 로고
    • Probing the shape of atoms in real space
    • Herz, M., F. J. Giessibl, and J. Mannhart, 2003, "Probing the shape of atoms in real space," Phys. Rev. B 68, 045301.
    • (2003) Phys. Rev. B , vol.68 , pp. 045301
    • Herz, M.1    Giessibl, F.J.2    Mannhart, J.3
  • 98
    • 0012105663 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 18
    • Hölscher, H., 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 18, pp. 349-370.
    • (2002) Noncontact Atomic Force Microscopy , pp. 349-370
    • Hölscher, H.1
  • 100
    • 0001207793 scopus 로고    scopus 로고
    • Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001) in the contact and noncontact regimes
    • Hölscher, H., A. Schwarz, W. Allers, U. D. Schwarz, and R. Wiesendanger, 2000, "Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001) in the contact and noncontact regimes," Phys. Rev. B 61, 12 678-12 681.
    • (2000) Phys. Rev. B , vol.61 , pp. 12678-12681
    • Hölscher, H.1    Schwarz, A.2    Allers, W.3    Schwarz, U.D.4    Wiesendanger, R.5
  • 101
    • 0042596028 scopus 로고    scopus 로고
    • Determination of tip-sample interaction potentials by dynamic force spectroscopy
    • Hölscher, H., U. D. Schwarz, and R. Wiesendanger, 1999, "Determination of tip-sample interaction potentials by dynamic force spectroscopy," Phys. Rev. Lett. 83, 4780-4783.
    • (1999) Phys. Rev. Lett. , vol.83 , pp. 4780-4783
    • Hölscher, H.1    Schwarz, U.D.2    Wiesendanger, R.3
  • 102
    • 24244445032 scopus 로고    scopus 로고
    • Proceedings of the Fifth International Conference on Noncontact Atomic Force Microscopy, Montreal, Canada, August 12-14, 2002 (to be published)
    • Hoffmann, P., 2003, in "Proceedings of the Fifth International Conference on Noncontact Atomic Force Microscopy, Montreal, Canada, August 12-14, 2002," Appl. Surf. Sci. (to be published).
    • (2003) Appl. Surf. Sci.
    • Hoffmann, P.1
  • 104
    • 0000123332 scopus 로고    scopus 로고
    • Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope
    • Hoffmann, P. M., A. Oral, R. A. Grimble, H. Özer, S. Jeffrey, and J. B. Pethica, 2001, "Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope," Proc. R. Soc. London, Ser. A 457, 1161-1174.
    • (2001) Proc. R. Soc. London, Ser. A , vol.457 , pp. 1161-1174
    • Hoffmann, P.M.1    Oral, A.2    Grimble, R.A.3    Özer, H.4    Jeffrey, S.5    Pethica, J.B.6
  • 106
    • 3142679888 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 7
    • Hosoi, H., K. Sueoka, K. Hayakawa, and K. Mukasa, 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 7, pp. 125-134.
    • (2002) Noncontact Atomic Force Microscopy , pp. 125-134
    • Hosoi, H.1    Sueoka, K.2    Hayakawa, K.3    Mukasa, K.4
  • 109
    • 0041766732 scopus 로고    scopus 로고
    • Seeing the atomic orbital: First-principles study of the effect of tip geometry on atomic force microscopy
    • Huang, M., M. Cuma, and F. Liu, 2003, "Seeing the atomic orbital: First-principles study of the effect of tip geometry on atomic force microscopy," Phys. Rev. Lett. 90, 256101.
    • (2003) Phys. Rev. Lett. , vol.90 , pp. 256101
    • Huang, M.1    Cuma, M.2    Liu, F.3
  • 110
    • 0003442771 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 20
    • Hug, H. J., and A. Baratoff, 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 20, pp. 395-432.
    • (2002) Noncontact Atomic Force Microscopy , pp. 395-432
    • Hug, H.J.1    Baratoff, A.2
  • 113
    • 0001105231 scopus 로고    scopus 로고
    • 3 microcantilever for dynamic scanning force microscopy
    • 3 microcantilever for dynamic scanning force microscopy," Appl. Phys. Lett. 69, 2036-2038.
    • (1996) Appl. Phys. Lett. , vol.69 , pp. 2036-2038
    • Itoh, T.1    Lee, C.2    Suga, T.3
  • 114
    • 14344279880 scopus 로고    scopus 로고
    • Can atomic force microscopy achieve atomic resolution in contact mode?
    • Jarvis, M. R., R. Prez, and M. C. Payne, 2001, "Can atomic force microscopy achieve atomic resolution in contact mode?" Phys. Rev. Lett. 86, 1287-1290.
    • (2001) Phys. Rev. Lett. , vol.86 , pp. 1287-1290
    • Jarvis, M.R.1    Prez, R.2    Payne, M.C.3
  • 116
    • 0029905789 scopus 로고    scopus 로고
    • Direct mechanical measurement of interatomic potentials
    • Jarvis, S. P., H. Yamada, H. Tokumoto, and J. B. Pethica, 1996, "Direct mechanical measurement of interatomic potentials," Nature (London) 384, 247-249.
    • (1996) Nature (London) , vol.384 , pp. 247-249
    • Jarvis, S.P.1    Yamada, H.2    Tokumoto, H.3    Pethica, J.B.4
  • 117
    • 0034826391 scopus 로고    scopus 로고
    • A simple non-equilibrium theory of non-contact dissipation force microscopy
    • Kantorovich, L. N., 2001, "A simple non-equilibrium theory of non-contact dissipation force microscopy," J. Phys.: Condens. Matter 13, 945-958.
    • (2001) J. Phys.: Condens. Matter , vol.13 , pp. 945-958
    • Kantorovich, L.N.1
  • 118
    • 0029634150 scopus 로고
    • Piezoelectric tip-sample distance control for near field optical microscopes
    • Karrai, K., and R. D. Grober, 1995, "Piezoelectric tip-sample distance control for near field optical microscopes," Appl. Phys. Lett. 66, 1842-1844.
    • (1995) Appl. Phys. Lett. , vol.66 , pp. 1842-1844
    • Karrai, K.1    Grober, R.D.2
  • 119
    • 0034906249 scopus 로고    scopus 로고
    • First-principles simulation of atomic force microscopy image formation on a GaAs(110) surface: Effect of tip morphology
    • Ke, S. H., T. Uda, I. Stich, and K. Terakura, 2001, "First-principles simulation of atomic force microscopy image formation on a GaAs(110) surface: Effect of tip morphology," Phys. Rev. B 63, 245323.
    • (2001) Phys. Rev. B , vol.63 , pp. 245323
    • Ke, S.H.1    Uda, T.2    Stich, I.3    Terakura, K.4
  • 121
    • 84956210548 scopus 로고
    • Observation of 7×7 reconstructed structure on the silicon(111) surface using ultrahigh vacuum noncontact atomic force microscopy
    • Kitamura, S., and M. Iwatsuki, 1995, "Observation of 7×7 reconstructed structure on the silicon(111) surface using ultrahigh vacuum noncontact atomic force microscopy," Jpn. J. Appl. Phys., Part 2 34, L145-L148.
    • (1995) Jpn. J. Appl. Phys., Part 2 , vol.34
    • Kitamura, S.1    Iwatsuki, M.2
  • 122
    • 0030144679 scopus 로고    scopus 로고
    • Observation of silicon surfaces using ultrahigh-vacuum noncontact atomic force microscopy
    • Kitamura, S., and M. Iwatsuki, 1996, "Observation of silicon surfaces using ultrahigh-vacuum noncontact atomic force microscopy," Jpn. J. Appl. Phys., Part 2 35, L668-L671.
    • (1996) Jpn. J. Appl. Phys., Part 2 , vol.35
    • Kitamura, S.1    Iwatsuki, M.2
  • 123
    • 0000862043 scopus 로고    scopus 로고
    • High-resolution imaging of contact potential difference with ultrahigh-vacuum non-contact atomic force microscopy
    • Kitamura, S., and M. Iwatsuki, 1998, "High-resolution imaging of contact potential difference with ultrahigh-vacuum non-contact atomic force microscopy," Appl. Phys. Lett. 72, 3154-3156.
    • (1998) Appl. Phys. Lett. , vol.72 , pp. 3154-3156
    • Kitamura, S.1    Iwatsuki, M.2
  • 124
    • 0034428631 scopus 로고    scopus 로고
    • Controlled modification of individual adsorbate electronic structure
    • Kliewer, J., R. Berndt, and S. Crampin, 2000, "Controlled modification of individual adsorbate electronic structure," Phys. Rev. Lett. 85, 4936-4939.
    • (2000) Phys. Rev. Lett. , vol.85 , pp. 4936-4939
    • Kliewer, J.1    Berndt, R.2    Crampin, S.3
  • 126
    • 49949134280 scopus 로고
    • Particle adhesion theory and experiment
    • Krupp, H., 1967, "Particle adhesion theory and experiment," Adv. Colloid Interface Sci. 1, 111-239.
    • (1967) Adv. Colloid Interface Sci. , vol.1 , pp. 111-239
    • Krupp, H.1
  • 128
    • 0038974917 scopus 로고
    • Scanning tunneling microscope instrumentation
    • Kuk, Y., and P. J. Silverman, 1988, "Scanning tunneling microscope instrumentation," Rev. Sci, Instrum. 60, 165-180.
    • (1988) Rev. Sci. Instrum. , vol.60 , pp. 165-180
    • Kuk, Y.1    Silverman, P.J.2
  • 132
    • 0037101132 scopus 로고    scopus 로고
    • Electrostatic forces in atomic force microscopy
    • Law, B. M., and F. Rieutord, 2002, "Electrostatic forces in atomic force microscopy," Phys. Rev. B 66, 035402.
    • (2002) Phys. Rev. B , vol.66 , pp. 035402
    • Law, B.M.1    Rieutord, F.2
  • 133
    • 0000448780 scopus 로고    scopus 로고
    • Contrast mechanism in non-contact SFM images of ionic surfaces
    • Livshits, A., A. Shluger, and A. Rohl, 1999, "Contrast mechanism in non-contact SFM images of ionic surfaces," Appl. Surf. Sci. 140, 327-332.
    • (1999) Appl. Surf. Sci. , vol.140 , pp. 327-332
    • Livshits, A.1    Shluger, A.2    Rohl, A.3
  • 134
    • 0001609799 scopus 로고    scopus 로고
    • Model of noncontact scanning force microscopy on ionic surfaces
    • Livshits, A., A. Shluger, A. Rohl, and A. Foster, 1999, "Model of noncontact scanning force microscopy on ionic surfaces," Phys. Rev. B 59, 2436-2448.
    • (1999) Phys. Rev. B , vol.59 , pp. 2436-2448
    • Livshits, A.1    Shluger, A.2    Rohl, A.3    Foster, A.4
  • 140
    • 0034598732 scopus 로고    scopus 로고
    • Quantum mirages formed by coherent projection of electronic structure
    • Manoharan, H., C. Lutz, and D. Eigler, 2000, "Quantum mirages formed by coherent projection of electronic structure," Nature (London) 403, 512-515.
    • (2000) Nature (London) , vol.403 , pp. 512-515
    • Manoharan, H.1    Lutz, C.2    Eigler, D.3
  • 142
    • 33750306098 scopus 로고
    • Atomic force microscope-force mapping and profiling on a sub 100-Å scale
    • Martin, Y., C. C. Williams, and H. K. Wickramasinghe, 1987, "Atomic force microscope-force mapping and profiling on a sub 100-Å scale," J. Appl. Phys. 61, 4723-4729.
    • (1987) J. Appl. Phys. , vol.61 , pp. 4723-4729
    • Martin, Y.1    Williams, C.C.2    Wickramasinghe, H.K.3
  • 143
    • 0343681011 scopus 로고
    • Atomic-scale friction of a tungsten tip on a graphite surface
    • Mate, M., G. M. McClelland, R. Erlandsson, and C. Chiang, 1987, "Atomic-scale friction of a tungsten tip on a graphite surface," Phys. Rev. Lett. 59, 1942-1945.
    • (1987) Phys. Rev. Lett. , vol.59 , pp. 1942-1945
    • Mate, M.1    McClelland, G.M.2    Erlandsson, R.3    Chiang, C.4
  • 147
    • 22644441587 scopus 로고
    • Optical-beam-deflection atomic force microscopy: The NaCl(100) surface
    • Meyer, G., and N. M. Amer, 1990, "Optical-beam-deflection atomic force microscopy: The NaCl(100) surface," Appl. Phys. Lett. 56, 2100-2101.
    • (1990) Appl. Phys. Lett. , vol.56 , pp. 2100-2101
    • Meyer, G.1    Amer, N.M.2
  • 148
    • 0001034488 scopus 로고    scopus 로고
    • Scanning tunneling microscopy manipulation of native substrate atoms: A new way to obtain registry information on foreign adsorbates
    • Meyer, G., S. Zöphel, and K.-H. Rieder, 1996, "Scanning tunneling microscopy manipulation of native substrate atoms: A new way to obtain registry information on foreign adsorbates," Phys. Rev. Lett. 77, 2113-2116.
    • (1996) Phys. Rev. Lett. , vol.77 , pp. 2113-2116
    • Meyer, G.1    Zöphel, S.2    Rieder, K.-H.3
  • 149
    • 0000448210 scopus 로고    scopus 로고
    • The atomic resolution imaging of metallic Ag(111) surface by noncontact atomic force microscopy
    • Minobe, S. O. T., T. Uchihashi, Y. Sugawara, and S. Morita, 1999, "The atomic resolution imaging of metallic Ag(111) surface by noncontact atomic force microscopy," Appl. Surf. Sci. 140, 243-246.
    • (1999) Appl. Surf. Sci. , vol.140 , pp. 243-246
    • Minobe, S.O.T.1    Uchihashi, T.2    Sugawara, Y.3    Morita, S.4
  • 152
    • 0141937011 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 1
    • Morita, S., 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 1, pp. 1-10.
    • (2002) Noncontact Atomic Force Microscopy , pp. 1-10
    • Morita, S.1
  • 153
    • 0141971753 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 3
    • Morita, S., and Y. Sugawara, 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 3, pp. 47-78.
    • (2002) Noncontact Atomic Force Microscopy , pp. 47-78
    • Morita, S.1    Sugawara, Y.2
  • 154
    • 0000448211 scopus 로고    scopus 로고
    • Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy, Osaka, Japan, July 21-23, 1998
    • Morita, S., and M. Tsukada, 1999, "Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy, Osaka, Japan, July 21-23, 1998," Appl. Surf. Sci. 140, 243-456.
    • (1999) Appl. Surf. Sci. , vol.140 , pp. 243-456
    • Morita, S.1    Tsukada, M.2
  • 156
    • 0031077589 scopus 로고    scopus 로고
    • Site discrimination of adatoms in Si(111)-7×7 by noncontact atomic force microscopy
    • Nakagiri, N., M. Suzuki, K. Okiguchi, and H. Sugimura, 1997, "Site discrimination of adatoms in Si(111)-7×7 by noncontact atomic force microscopy," Surf. Sci. Lett. 373, L329-L332.
    • (1997) Surf. Sci. Lett. , vol.373
    • Nakagiri, N.1    Suzuki, M.2    Okiguchi, K.3    Sugimura, H.4
  • 157
    • 0001361115 scopus 로고
    • True atomic resolution by atomic force microscopy through repulsive and attractive forces
    • Ohnesorge, F., and G. Binning, 1993, "True atomic resolution by atomic force microscopy through repulsive and attractive forces," Science 260, 1451-1456.
    • (1993) Science , vol.260 , pp. 1451-1456
    • Ohnesorge, F.1    Binning, G.2
  • 158
    • 0001689001 scopus 로고    scopus 로고
    • A method for in situ characterization of tip shape in ac-mode atomic force microscopy using electrostatic interaction
    • Olsson, L., N. Lin, V. Yakimov, and R. Erlandsson, 1998, "A method for in situ characterization of tip shape in ac-mode atomic force microscopy using electrostatic interaction," J. Appl. Phys. 84, 4060-4064.
    • (1998) J. Appl. Phys. , vol.84 , pp. 4060-4064
    • Olsson, L.1    Lin, N.2    Yakimov, V.3    Erlandsson, R.4
  • 159
    • 0035903347 scopus 로고    scopus 로고
    • Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy
    • Oral, A., R. A. Grimble, H. Özgur Özer, P. M. Hoffmann, and J. B. Pethica, 2001, "Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy," Appl. Phys. Lett. 79, 1915-1917.
    • (2001) Appl. Phys. Lett. , vol.79 , pp. 1915-1917
    • Oral, A.1    Grimble, R.A.2    Özgur Özer, H.3    Hoffmann, P.M.4    Pethica, J.B.5
  • 160
    • 0141971755 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 9
    • Pang, C. L., and G. Thornton, 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 9, pp. 147-166.
    • (2002) Noncontact Atomic Force Microscopy , pp. 147-166
    • Pang, C.L.1    Thornton, G.2
  • 161
    • 33645828282 scopus 로고
    • edited by J. A. Stroscio and W. J. Kaiser (Academic, Boston), Chap. 2
    • Park, S. I., and R. C. Barrett, 1993, in Scanning Tunneling Microscopy, edited by J. A. Stroscio and W. J. Kaiser (Academic, Boston), Chap. 2, pp. 31-76.
    • (1993) Scanning Tunneling Microscopy , pp. 31-76
    • Park, S.I.1    Barrett, R.C.2
  • 164
    • 0001281426 scopus 로고    scopus 로고
    • Role of covalent tip-surface interactions in noncontact atomic force microscopy on reactive surfaces
    • Perez, R., I. Stich, M. C. Payne, and K. Terakura, 1997, "Role of covalent tip-surface interactions in noncontact atomic force microscopy on reactive surfaces," Phys. Rev. Lett. 78, 678-681.
    • (1997) Phys. Rev. Lett. , vol.78 , pp. 678-681
    • Perez, R.1    Stich, I.2    Payne, M.C.3    Terakura, K.4
  • 165
    • 0037514481 scopus 로고    scopus 로고
    • Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111)
    • Perez, R., I. Stich, M. C. Payne, and K. Terakura, 1998, "Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111)," Phys. Rev. B 58, 10 835-10 849.
    • (1998) Phys. Rev. B , vol.58 , pp. 10835-10849
    • Perez, R.1    Stich, I.2    Payne, M.C.3    Terakura, K.4
  • 166
    • 0000840745 scopus 로고
    • Comment on 'Interatomic forces in scanning tunneling microscopy: Giant corrugations of the graphite surface,'
    • Pethica, J. B., 1986, "Comment on 'Interatomic forces in scanning tunneling microscopy: Giant corrugations of the graphite surface,' " Phys. Rev. Lett. 57, 3235.
    • (1986) Phys. Rev. Lett. , vol.57 , pp. 3235
    • Pethica, J.B.1
  • 167
    • 0035499886 scopus 로고    scopus 로고
    • The insulator uncovered
    • Pethica, J. B., and R. Egdell, 2001, "The insulator uncovered, " Nature (London) 414, 27-29.
    • (2001) Nature (London) , vol.414 , pp. 27-29
    • Pethica, J.B.1    Egdell, R.2
  • 168
  • 171
    • 0141937010 scopus 로고    scopus 로고
    • edited by S. Morita, R. Weisendanger, and E. Meyer (Springer, Berlin), Chap. 6
    • Reichling, M., and C. Barth, 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Weisendanger, and E. Meyer (Springer, Berlin), Chap. 6, pp. 109-124.
    • (2002) Noncontact Atomic Force Microscopy , pp. 109-124
    • Reichling, M.1    Barth, C.2
  • 172
    • 0000153077 scopus 로고    scopus 로고
    • Atomic steps with tuning-fork-based noncontact atomic force microscopy
    • Rensen, W. H. J., N. F. van der Hulst, A. G. T. Ruiter, and P. E. West, 1999, "Atomic steps with tuning-fork-based noncontact atomic force microscopy," Appl. Phys. Lett. 75, 1640-1642.
    • (1999) Appl. Phys. Lett. , vol.75 , pp. 1640-1642
    • Rensen, W.H.J.1    Van der Hulst, N.F.2    Ruiter, A.G.T.3    West, P.E.4
  • 173
    • 0141937009 scopus 로고    scopus 로고
    • Physical Review Letters' Top Ten. Number 4: Atomic force microscopy
    • Riordon, J., 2003, "Physical Review Letters' Top Ten. Number 4: Atomic force microscopy," APS News 12 (5), 3.
    • (2003) APS News , vol.12 , Issue.5 , pp. 3
    • Riordon, J.1
  • 174
    • 11944250146 scopus 로고
    • Atomic force microscopy
    • Rugar, D., and P. Hansma, 1990, "Atomic force microscopy," Phys. Today 43 (10), 23-30.
    • (1990) Phys. Today , vol.43 , Issue.10 , pp. 23-30
    • Rugar, D.1    Hansma, P.2
  • 176
    • 0000811029 scopus 로고    scopus 로고
    • A low-temperature dynamic mode scanning force microscope operating in high magnetic fields
    • Rychen, J., T. Ihn, P. Studerus, A. Herrmann, and K. Ensslin, 1999, "A low-temperature dynamic mode scanning force microscope operating in high magnetic fields," Rev. Sci. Instrum. 70, 2765-2768.
    • (1999) Rev. Sci. Instrum. , vol.70 , pp. 2765-2768
    • Rychen, J.1    Ihn, T.2    Studerus, P.3    Herrmann, A.4    Ensslin, K.5
  • 178
    • 0141902601 scopus 로고    scopus 로고
    • edited by S. Morita, R. Weisendanger, and E. Meyer (Springer, Berlin), Chap. 13
    • Sasahara, A., and H. Onishi, 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Weisendanger, and E. Meyer (Springer, Berlin), Chap. 13, pp. 215-232.
    • (2002) Noncontact Atomic Force Microscopy , pp. 215-232
    • Sasahara, A.1    Onishi, H.2
  • 179
    • 0032070973 scopus 로고    scopus 로고
    • The relation between resonance curves and tip-surface interaction potential in noncontact atomic-force microscopy
    • Sasaki, N., and M. Tsukada, 1998, "The relation between resonance curves and tip-surface interaction potential in noncontact atomic-force microscopy," Jpn. J. Appl. Phys., Part 2 37, L533-L535.
    • (1998) Jpn. J. Appl. Phys., Part 2 , vol.37
    • Sasaki, N.1    Tsukada, M.2
  • 180
    • 0000305457 scopus 로고    scopus 로고
    • Theory for the effect of the tip-surface interaction potential on atomic resolution in forced vibration system of noncontact AFM
    • Sasaki, N., and M. Tsukada, 1999, "Theory for the effect of the tip-surface interaction potential on atomic resolution in forced vibration system of noncontact AFM," Appl. Surf. Sci. 140, 339-343.
    • (1999) Appl. Surf. Sci. , vol.140 , pp. 339-343
    • Sasaki, N.1    Tsukada, M.2
  • 181
    • 0034472390 scopus 로고    scopus 로고
    • Effect of microscopic non-conservative process on noncontact atomic force microscopy
    • Sasaki, N., and M. Tsukada, 2000, "Effect of microscopic non-conservative process on noncontact atomic force microscopy," Jpn. J. Appl. Phys., Part 2 39 (12B), L1334-L1337.
    • (2000) Jpn. J. Appl. Phys., Part 2 , vol.39 , Issue.12 B
    • Sasaki, N.1    Tsukada, M.2
  • 182
    • 0142006411 scopus 로고    scopus 로고
    • Diploma thesis (University of Augsburg) (English translation: "Characterization of STM/AFM tips and atomically resolved measurements of the decay characteristics of the tunneling current)
    • Schiller, C., 2003, "Charakterisierung von STM/AFM Spitzen und atomar aufgelöste Messungen zum Abklingverhalten des Tunnelstroms," Diploma thesis (University of Augsburg) (English translation: "Characterization of STM/AFM tips and atomically resolved measurements of the decay characteristics of the tunneling current").
    • (2003) Charakterisierung Von STM/AFM Spitzen und Atomar Aufgelöste Messungen Zum Abklingverhalten Des Tunnelstroms
    • Schiller, C.1
  • 183
    • 0033116238 scopus 로고    scopus 로고
    • True atomic resolution under ambient conditions obtained by atome force microscopy in the contact mode
    • Schimmel, T., T., Koch, J. Küppers, and M. Lux-Steiner, 1999, "True atomic resolution under ambient conditions obtained by atome force microscopy in the contact mode," Appl. Phys. A: Mater. Sci. Process. 68, 399-402.
    • (1999) Appl. Phys. A: Mater. Sci. Process , vol.68 , pp. 399-402
    • Schimmel, T.1    Koch, T.2    Küppers, J.3    Lux-Steiner, M.4
  • 185
    • 0000510170 scopus 로고    scopus 로고
    • Simultaneous imaging of the in and As sublattice on InAs(110)-(1×1) with dynamic scanning force microscopy
    • Schwarz, A., W. Allers, U. Schwarz, and R. Wiesendanger, 1999, "Simultaneous imaging of the In and As sublattice on InAs(110)-(1×1) with dynamic scanning force microscopy," Appl. Surf. Sci. 140, 293-297.
    • (1999) Appl. Surf. Sci. , vol.140 , pp. 293-297
    • Schwarz, A.1    Allers, W.2    Schwarz, U.3    Wiesendanger, R.4
  • 186
    • 4244109656 scopus 로고    scopus 로고
    • Proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, Hamburg, Germany, July 16-19, 2000
    • Schwarz, U. D., H. Hölscher, and R. Wiesendanger, 2001, in "Proceedings of the Third International Conference on Non-Contact Atomic Force Microscopy, Hamburg, Germany, July 16-19, 2000," Appl. Phys. A: Mater. Sci. Process. 72 (Supplement), S1-S141.
    • (2001) Appl. Phys. A: Mater. Sci. Process. , vol.72 , Issue.SUPPL.
    • Schwarz, U.D.1    Hölscher, H.2    Wiesendanger, R.3
  • 187
    • 0000881651 scopus 로고    scopus 로고
    • Ionic and electronic processes at ionic surfaces induced by atomic-force-microscope tips
    • Shluger, A. L., L. N. Kantorovich, A. I. Livshits, and M. J. Gillan, 1997, "Ionic and electronic processes at ionic surfaces induced by atomic-force-microscope tips," Phys. Rev. B 56, 15 332-15 344.
    • (1997) Phys. Rev. B , vol.56 , pp. 15332-15344
    • Shluger, A.L.1    Kantorovich, L.N.2    Livshits, A.I.3    Gillan, M.J.4
  • 189
    • 0000975668 scopus 로고
    • Limits of force microscopy
    • Smith, D. P. E., 1995, "Limits of force microscopy," Rev. Sci. Instrum. 66, 3191-3195.
    • (1995) Rev. Sci. Instrum. , vol.66 , pp. 3191-3195
    • Smith, D.P.E.1
  • 191
    • 4243754961 scopus 로고
    • Computer simulation of local order in condensed phases of silicon
    • Stillinger, F. H., and T. A. Weber, 1985, "Computer simulation of local order in condensed phases of silicon," Phys. Rev. B 31, 5262-5271.
    • (1985) Phys. Rev. B , vol.31 , pp. 5262-5271
    • Stillinger, F.H.1    Weber, T.A.2
  • 193
    • 0142006412 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 11
    • Sugawara, Y., 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 11, pp. 183-192.
    • (2002) Noncontact Atomic Force Microscopy , pp. 183-192
    • Sugawara, Y.1
  • 194
    • 0040806880 scopus 로고
    • Defect motion on an InP(110) surface observed with noncontact atomic force microscopy
    • Sugawara, Y. M. Ohta, H. Ueyama, and S. Morita, 1995, "Defect motion on an InP(110) surface observed with noncontact atomic force microscopy," Science 270, 1646-1648.
    • (1995) Science , vol.270 , pp. 1646-1648
    • Sugawara1    Ohta, Y.M.2    Ueyama, H.3    Morita, S.4
  • 195
    • 0039620693 scopus 로고    scopus 로고
    • Materials Research Society 1996 Fall Meeting (Boston, December 1996), edited by J. Michel, T. Kennedy, K. Wada, and K. Thonke (Materials Research Society, Warrendale, PA)
    • Sugawara, Y. H. Ueyama, T. Uchihashi, M. Ohta, Y. Yanase, T. Shigematsu, M. Suzuki, and S. Morita, 1997, in Materials Research Society 1996 Fall Meeting (Boston, December 1996), Proceedings E: Defects in Electric Materials II, edited by J. Michel, T. Kennedy, K. Wada, and K. Thonke (Materials Research Society, Warrendale, PA), p. 16.
    • (1997) Proceedings E: Defects in Electric Materials II , pp. 16
    • Sugawara, Y.1    Ueyama, H.2    Uchihashi, T.3    Ohta, M.4    Yanase, Y.5    Shigematsu, T.6    Suzuki, M.7    Morita, S.8
  • 196
    • 0014641524 scopus 로고
    • Direct measurement of normal and retarded van der Waals forces
    • Tabor, D., and R. H. S. Winterton, 1969, "Direct measurement of normal and retarded van der Waals forces," Proc. R. Soc. London, Ser. A 312, 435-450.
    • (1969) Proc. R. Soc. London, Ser. A , vol.312 , pp. 435-450
    • Tabor, D.1    Winterton, R.H.S.2
  • 197
    • 84913417435 scopus 로고
    • Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopy
    • Takayanagi, K., Y. Tanishiro, M. Takahashi, and S. Takahashi, 1985, "Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopy," J. Vac. Sci. Technol. A 3, 1502-1506.
    • (1985) J. Vac. Sci. Technol. A , vol.3 , pp. 1502-1506
    • Takayanagi, K.1    Tanishiro, Y.2    Takahashi, M.3    Takahashi, S.4
  • 198
    • 0034895282 scopus 로고    scopus 로고
    • Effect of tip morphology on image formation in noncontact atomic force microscopy: InP(110)
    • Tobik, J., I. Stich, and K. Terakura, 2001, "Effect of tip morphology on image formation in noncontact atomic force microscopy: InP(110)," Phys. Rev. B 63, 245324.
    • (2001) Phys. Rev. B , vol.63 , pp. 245324
    • Tobik, J.1    Stich, I.2    Terakura, K.3
  • 199
    • 0032095610 scopus 로고    scopus 로고
    • Magnetic force microscopy using nonoptical piezoelectric quartz tuning fork detection design with applications to magnetic recording studies
    • Todorovic, M., and S. Schulz, 1998, "Magnetic force microscopy using nonoptical piezoelectric quartz tuning fork detection design with applications to magnetic recording studies," J. Appl. Phys. 83, 6229-6231.
    • (1998) J. Appl. Phys. , vol.83 , pp. 6229-6231
    • Todorovic, M.1    Schulz, S.2
  • 200
    • 0000672235 scopus 로고
    • A molecular theory of friction
    • Tomlinson, G. A., 1929, "A molecular theory of friction," Philos. Mag. 7, 905-939.
    • (1929) Philos. Mag. , vol.7 , pp. 905-939
    • Tomlinson, G.A.1
  • 201
    • 21544472129 scopus 로고
    • Atomic resolution with an atomic force microscope using piezoresistive detection
    • Tortonese, M., R. C. Barrett, and C. Quate, 1993, "Atomic resolution with an atomic force microscope using piezoresistive detection, " Appl. Phys. Lett. 62, 834-836.
    • (1993) Appl. Phys. Lett. , vol.62 , pp. 834-836
    • Tortonese, M.1    Barrett, R.C.2    Quate, C.3
  • 202
    • 0032500989 scopus 로고    scopus 로고
    • Tapping-mode tuning fork force sensing for near-field scanning optical microscopy
    • Tsai, D. P., and Y. Y. Lu, 1998, "Tapping-mode tuning fork force sensing for near-field scanning optical microscopy," Appl. Phys. Lett. 73, 2724-2726.
    • (1998) Appl. Phys. Lett. , vol.73 , pp. 2724-2726
    • Tsai, D.P.1    Lu, Y.Y.2
  • 203
    • 0037187211 scopus 로고    scopus 로고
    • Proceedings of the Fourth International Conference on Noncontact Atomic Force Microscopy, Kyoto, Japan, September 21-23, 2001
    • Tsukada, M., and S. Morita, 2002, in "Proceedings of the Fourth International Conference on Noncontact Atomic Force Microscopy, Kyoto, Japan, September 21-23, 2001," Appl. Surf. Sci. 188, 231-554.
    • (2002) Appl. Surf. Sci. , vol.188 , pp. 231-554
    • Tsukada, M.1    Morita, S.2
  • 205
    • 0000964221 scopus 로고    scopus 로고
    • Stable operation mode for dynamic noncontact atomic force microscopy
    • Ueyama, H., Y. Sugawara, and S. Morita, 1998, "Stable operation mode for dynamic noncontact atomic force microscopy," Appl. Phys. A: Mater. Sci. Process. 66(Supplement), S295-S297.
    • (1998) Appl. Phys. A: Mater. Sci. Process. , vol.66 , Issue.SUPPL.
    • Ueyama, H.1    Sugawara, Y.2    Morita, S.3
  • 206
    • 0141937008 scopus 로고
    • edited by E. Gerber and A. Ballato (Academic, Orlando, FL)
    • Walls, F. L., 1985, in Precision Frequency Control, edited by E. Gerber and A. Ballato (Academic, Orlando, FL), pp. 276-279.
    • (1985) Precision Frequency Control , pp. 276-279
    • Walls, F.L.1
  • 207
    • 0000752377 scopus 로고    scopus 로고
    • Analytical descriptions of the tapping-mode atomic force microscopy response
    • Wang, L., 1998, "Analytical descriptions of the tapping-mode atomic force microscopy response," Appl. Phys. Lett. 73, 3781-3783.
    • (1998) Appl. Phys. Lett. , vol.73 , pp. 3781-3783
    • Wang, L.1
  • 208
    • 0002038193 scopus 로고
    • Scanned-Probe Microscopes
    • Wickramasinghe, H. K., 1989, "Scanned-Probe Microscopes," Sci. Am. 261 (4), 74-81.
    • (1989) Sci. Am. , vol.261 , Issue.4 , pp. 74-81
    • Wickramasinghe, H.K.1
  • 211
    • 84881605956 scopus 로고
    • Micromachined silicon sensors for scanning force microscopy
    • Wolter, O., T. Bayer, and J. Greschner, 1991, "Micromachined silicon sensors for scanning force microscopy," J. Vac. Sci. Technol. A 9, 1353-1357.
    • (1991) J. Vac. Sci. Technol. A , vol.9 , pp. 1353-1357
    • Wolter, O.1    Bayer, T.2    Greschner, J.3
  • 212
    • 1442319776 scopus 로고    scopus 로고
    • edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 12
    • Yamada, H., 2002, in Noncontact Atomic Force Microscopy, edited by S. Morita, R. Wiesendanger, and E. Meyer (Springer, Berlin), Chap. 12, pp. 193-214.
    • (2002) Noncontact Atomic Force Microscopy , pp. 193-214
    • Yamada, H.1
  • 213
    • 0001075493 scopus 로고    scopus 로고
    • Atomically resolved silver imaging on the Si(111)-(√3 ×√3)-Ag surface using a noncontact atomic force microscope
    • Yokoyama, K., T. Ochi, Y. Sugawara, and S. Morita, 1999, "Atomically resolved silver imaging on the Si(111)-(√3 ×√3)-Ag surface using a noncontact atomic force microscope," Phys. Rev. Lett. 83, 5023-5026.
    • (1999) Phys. Rev. Lett. , vol.83 , pp. 5023-5026
    • Yokoyama, K.1    Ochi, T.2    Sugawara, Y.3    Morita, S.4
  • 214
    • 0027610690 scopus 로고
    • Fractured polymer silica fiber surface studied by tapping mode atomic-force microscopy
    • Zhong, Q., D. Innis, K. Kjoller, and V. B. Elings, 1993, "Fractured polymer silica fiber surface studied by tapping mode atomic-force microscopy," Surf. Sci. 290, L688-L692.
    • (1993) Surf. Sci. , vol.290
    • Zhong, Q.1    Innis, D.2    Kjoller, K.3    Elings, V.B.4


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