Scanned probe microscopy of electronic transport in carbon nanotubes

Physical Review Letters

Volumn 84, Issue 26, 2000, Pages 6082-6085

  Bachtold, A ^a,b   Fuhrer, M S ^a,b   Plyasunov, S ^a,b   Forero, M ^a,b   Anderson, Erik H ^b   Zettl, A ^a,b   McEuen, Paul L ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; ELECTRON TRANSPORT PROPERTIES; ELECTRONIC PROPERTIES; MICROSCOPIC EXAMINATION; SEMICONDUCTOR MATERIALS;

ELECTROSTATIC FORCE MICROSCOPY; MULTIWALLED CARBON NANOTUBES; SCANNED GATE MICROSCOPY; SINGLE-WALLED CARBON NANOTUBES;

NANOTUBES;

EID: 5444249586     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.84.6082     Document Type: Article

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