Performance of visible and mid-infrared scattering-type near-field optical microscopes

Journal of Microscopy

Volumn 210, Issue 3, 2003, Pages 311-314

  Taubner, T ^a   Hillenbrand, R ^a   Keilmann, F ^a  

^a MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPES; NEAR FIELD SCANNING OPTICAL MICROSCOPY;

INFRARED SCATTERING; INTERFEROMETRIC DETECTION; MIDINFRARED; NEAR FIELD OPTICAL MICROSCOPE; PERFORMANCE; PHASE-CONTRAST IMAGING; PROBE TIPS; SCATTERED RADIATIONS; SELECTABLE WAVELENGTHS; THREE-COMPONENT;

REFRACTIVE INDEX;

ARTICLE; ARTIFACT; MEASUREMENT; MECHANICAL PROBE; MICROWAVE RADIATION; PERFORMANCE; PHASE CONTRAST MICROSCOPE; PRIORITY JOURNAL; RADIATION SCATTERING; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SPECTRAL SENSITIVITY;

EID: 0037663775     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2003.01164.x     Document Type: Article

References (14)

1. Ash, E.A. & Nicholls, G. (1972) Super-resolution aperture scanning microscope. Nature, 237, 510-512.
2. Hecht, B., Sick, B., Wild, U.P., et al. (2000) Scanning near-field optical microscopy with aperture probes: fundamentals and applications. J. Chem. Phys. 112, 7761-7774.
3. Hillenbrand, R. & Keilmann, F. (2000) Complex optical constants on a subwavelength scale. Phys Rev. Lett. 85, 3029-3032.
4. Hillenbrand, R. & Keilmann, F. (2002) Material-specific mapping of metal/semiconductor/dielectric nanosystems at 10 nm resolution by back-scattering near-field optical microscopy. Appl. Physics Lett. 80, 25.
5. Hillenbrand, R., Knoll, B. & Keilmann, F. (2000) Optische Nahfeld-mikroskopie. German patent application DE 10035134.
6. Hillenbrand, R., Knoll, B. & Keilmann, F. (2001) Pure optical contrast in scattering-type scanning near-field optical microscopy. J. Microsc. 202, 77-83.
7. Hillenbrand, R., Taubner, T. & Keilmann, F. (2002) Phonon-enhanced light-matter interaction at the nanometer scale. Nature, 418, 159-162.
8. Inouye, Y. & Kawata, S. (1994) Near-field scanning optical microscope with a metallic probe tip. Optics Lett. 19(3), 159-161.
9. Knoll, B. & Keilmann, F. (1999) Near-field probing of vibrational absorption for chemical microscopy. Nature, 399, 134-137.
10. Knoll, B. & Keilmann, F. (2000) Infrared conductivity mapping for nanoelectronics. Appl. Phys. Lett. 77, 3980-3982.
11. Koglin, J., Fischer, U.C. & Fuchs, H. (1997) Material contrast in scanning near-field optical microscopy at 1-10 nm resolution. Phys Rev. B, 55, 7977-7984.
12. Lahrech, A., Bachelot, R., Gleyzes, P., et al. (1996) Infrared-reflection-mode near-field microscopy using an apertureless probe with a resolution of λ/600. Optics Lett. 21, 1315-1317.
13. Specht, M., Pedarnig, J.D., Heckl, W.M., et al. (1992) Scanning plasmon near-field microscopy. Phys. Rev. Lett. 68, 476-479.
14. Wickramasinghe, H.K. & Williams, C.C. (1990) Apertureless Near Field Optical Microscope. US Patent: 4.947.034.