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Volumn 99, Issue 18, 2007, Pages

Atomic dipole moment distribution of Si atoms on a Si(111)-(7×7) surface studied using noncontact scanning nonlinear dielectric microscopy

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CHEMICAL ANALYSIS; DIELECTRIC MATERIALS; DIPOLE MOMENT; ELECTRIC POTENTIAL; SCANNING ELECTRON MICROSCOPY;

ATOMIC DIPOLE MOMENT; SCANNING NONLINEAR DIELECTRIC MICROSCOPY; VOLTAGE DEPENDENCE;

SILICON COMPOUNDS;

EID: 35948989303 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.99.186101 Document Type: Article

Times cited : (49)

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