Manipulation of organic "needles" using an STM operated under SEM control

Surface Science

Volumn 600, Issue 12, 2006, Pages 2411-2416

  Hanel K ^a,b   Birkner, A ^a,b   Mullegger S ^a,b   Winkler, A ^a,b   Woll Ch ^a,b  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CONDITION MONITORING; CRYSTAL GROWTH; CRYSTALLINE MATERIALS; DEFLECTION (STRUCTURES); IMAGING TECHNIQUES; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

MICROGRAPHS; NANOCRYSTALS; STM MICROGRAPHS; STM TIPS;

NANOSTRUCTURED MATERIALS;

EID: 33744997367     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.03.030     Document Type: Article

References (14)

1. Witte G., and Wöll C. J. Mater. Res. 19 (2004) 1889
2. Balzer F., and Rubahn H.-G. Phys. Unserer. Zeit. 36 (2005) 36
3. Balzer F., and Rubahn H.-G. Adv. Funct. Mater. 15 (2005) 17
4. Balzer F., Beerman J., Bozhevolnyi S.I., Simonsen A.C., and Rubahn H.-G. Nano Lett. 3 (2003) 1311
5. Balzer F., and Rubahn H.-G. Surf. Sci. 548 (2004) 170
6. Quochi F., Cordella F., Orrù R., Communal J.E., Verzeroli P., Mura A., Bongiovanni G., Andreev A., Sitter H., and Sariciftci N.S. Appl. Phys. Lett. 84 (2004) 4454
7. Müllegger S., Salzmann I., Resel R., Hlawacek G., Teichert C., and Winkler A. J. Chem. Phys. 121 (2004) 2272
8. Hlawacek G., Teichert C., Müllegger S., Resel R., and Winkler A. Synth. Met. 146 (2004) 383
9. Müllegger S., Mitsche S., Pölt P., Hänel K., Birkner A., Wöll C., and Winkler A. Thin Solid Films 484 (2005) 408
10. Sato T., Kitamura S., and Iwatsuki M. J. Vac. Sci. Technol. A 18 (2000) 960
11. S. Müllegger et al., in press.
12. Braun K.-F., and Hla S.-W. Nano Lett. 5 (2005) 73
13. Koch N., Heimel G., Wu J., Zojer E., Johnson R.L., Brédas J.L., Müllen K., and Rabe J.P. Chem. Phys. Lett. 413 (2005) 390
14. Müllegger S., Stranik O., Zojer E., and Winkler A. Appl. Surf. Sci. 221 (2004) 184