Overcoming variations in nanometer-scale technologies

IEEE Journal on Emerging and Selected Topics in Circuits and Systems

Volumn 1, Issue 1, 2011, Pages 5-18

  Sapatnekar, Sachin S ^a  

^a University of Minnesota   (United States)

Author keywords

On chip sensors; power supply variations; process variations; thermal variations; thermally aware design

Indexed keywords

ON-CHIP SENSORS; POWER SUPPLY VARIATIONS; PROCESS VARIATIONS; THERMAL VARIATIONS; THERMALLY AWARE DESIGN;

UNCERTAINTY ANALYSIS;

TIMING CIRCUITS;

EID: 79957847236     PISSN: 21563357     EISSN: None     Source Type: Journal    
DOI: 10.1109/JETCAS.2011.2138250     Document Type: Article

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