Silicon odometer: An on-chip reliability monitor for measuring frequency degradation of digital circuits

IEEE Journal of Solid-State Circuits

Volumn 43, Issue 4, 2008, Pages 874-880

  Kim, Tae Hyoung ^a,b   Persaud, Randy ^a,b   Kim, Chris H ^a,b  

^a IEEE

^b University of Minnesota   (United States)

Author keywords

Aging; Degradation; Monitoring circuit; NBTI; Reliability

Indexed keywords

AGING OF MATERIALS; DEGRADATION; ELECTRIC FREQUENCY MEASUREMENT; RELIABILITY; SILICON;

DIGITAL CIRCUIT DEGRADATION; FREQUENCY DEGRADATION; MONITORING CIRCUITS; SILICON ODOMETERS;

MICROPROCESSOR CHIPS;

EID: 41549122836     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2008.917502     Document Type: Conference Paper

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