Analysis and minimization techniques for total leakage considering gate oxide leakage

Proceedings - Design Automation Conference

Volumn , Issue , 2003, Pages 175-180

  Lee, Dongwoo ^a   Kwong, Wesley ^a   Blaauw, David ^a   Sylvester, Dennis ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Algorithms; Design; Performance; Reliability

Indexed keywords

ALGORITHMS; CMOS INTEGRATED CIRCUITS; LEAKAGE CURRENTS; LOGIC GATES; NETWORKS (CIRCUITS); RELIABILITY;

TOTAL LEAKAGE POWER;

GATES (TRANSISTOR);

EID: 0041589378     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/775876.775878     Document Type: Conference Paper

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