Defining statistical sensitivity for timing optimization of logic circuits with large-scale process and environmental variations

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn 2005, Issue , 2005, Pages 844-851

  Li, Xin ^a   Le, Jiayong ^a   Celik, Mustafa ^a   Pileggi, Lawrence T ^b  

^a Extreme DA   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; GRAPH THEORY; LARGE SCALE SYSTEMS; PROBABILITY; STATISTICAL METHODS;

SENSITIVITY COMPUTATION; STATISTICAL TIMING ANALYSIS;

LOGIC CIRCUITS;

EID: 33751398442     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2005.1560180     Document Type: Conference Paper

References (16)

1. X. Li, J. Le, M. Celik, and L. Pileggi, "Defining statistical sensitivity for timing optimization of logic circuits with large-scale process and environmental variations," Docket MC06172004P, Filed with the US Patent Office, Jun. 2005.
2. S. Nasif, "Modeling and analysis of manufacturing variations," IEEE CICC, pp. 223-228, 2001.
3. J. Liou, A. Krstic, L. Wang and K. Cheng, "False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation," IEEE/ACM D AC, pp. 566-569, 2002.
4. M. Orshansky and K. Keutzer, "A general probabilistic framework for worst case timing analysis," IEEE/ACM DAC, pp. 556-561, 2002.
5. J. Jess, K. Kalafala, S. Naidu, R. Otten and C. Visweswariah, "Statistical timing for parametric yield prediction of digital integrated circuits," IEEE/ACM DAC, pp. 932-937, 2003.
6. J. Liou, K. Chen, S. Kundu and A. Krstic, "Fast statistical timing analysis by probabilistic event propagation," IEEE/ACM DAC, pp. 661-666, 2001.
7. A. Agarwal, V. Zolotov and D. Blaauw, "Statistical timing analysis using bounds and selective enumeration," IEEE Trans. CAD, Vol. 22, No. 9, pp. 1243-1260, Sep. 2003.
8. A. Devgan and C. Kashyap, "Block-based static timing analysis with uncertainty," IEEE/ACM ICCAD, pp. 607-614, 2003.
9. A. Agarwal, D. Blaauw and V. Zolotov, "Statistical timing analysis for intra-die process variations with spatial correlations," IEEE/ACM ICCAD, pp. 900-907, 2003.
10. H. Chang and S. Sapatnekar, "Statistical timing analysis considering spatial correlations using a single PERT-like traversal," IEEE/ACM ICCAD, pp. 621-625, 2003.
11. C. Visweswariah, K. Ravindran, K. Kalafala, S. Walker and S. Narayan, "First-order incremental block-based statistical timing analysis," IEEE/ACMDAC, pp. 331-336, 2004.
12. J. Le, X. Li and L. Pileggi, "STAC: statistical timing analysis with correlation," IEEE/ACMDAC, pp. 343-348, 2004.
13. X. Bai, C. Visweswariah, P. Strenski and D. Hathaway, "Uncertainty-aware circuit optimization," IEEE/ACM DAC, pp. 58-63, 2002.
14. A. Papoulis and S. Pillai, Probability, Random Variables and Stochastic Processes, McGraw-Hill, 2001.
15. G. Seber, Multivariate Observations, Wiley Series, 1984.
16. C. Clark, "The greatest of a finite set of random variables," Operations Research, pp. 145-162, Mar.-Apr., 1961.