Parametric yield estimation considering leakage variability

Proceedings - Design Automation Conference

Volumn , Issue , 2004, Pages 442-447

  Rao, Rajeev R ^a   Devgan, Anirudh ^b   Blaauw, David ^a   Sylvester, Dennis ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b IBM   (United States)

Author keywords

Leakage; Parametric yield; Variability

Indexed keywords

CORRELATION METHODS; DELAY CIRCUITS; INVERSE PROBLEMS; MICROPROCESSOR CHIPS; NATURAL FREQUENCIES; PARAMETER ESTIMATION; RANDOM PROCESSES;

LEAKAGE; PARAMETRIC YIELD; PERFORMANCE ANALYSIS; VARIABILITY;

LEAKAGE CURRENTS;

EID: 4444351567     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/996566.996693     Document Type: Conference Paper

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