Soft errors in advanced semiconductor devices-part i: the three radiation sources

IEEE Transactions on Device and Materials Reliability

Volumn 1, Issue 1, 2001, Pages 17-22

  Baumann, Robert C ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

Alpha particle; Cosmic ray neutron; Single event upset

Indexed keywords

EID: 1542690244     PISSN: 15304388     EISSN: 15304388     Source Type: Journal    
DOI: 10.1109/7298.946456     Document Type: Article

References (21)

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