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Volumn 2003-January, Issue , 2003, Pages 84-89

Statistical estimation of leakage current considering inter- and intra-die process variation

Author keywords

Benchmark testing; Circuit testing; Delay estimation; Integrated circuit modeling; Leakage current; MOS devices; Permission; Probability density function; Semiconductor device modeling; Threshold voltage

Indexed keywords

DIES; ELECTRONIC EQUIPMENT TESTING; INTEGRATED CIRCUIT TESTING; INTELLIGENT SYSTEMS; LOW POWER ELECTRONICS; MONTE CARLO METHODS; MOS DEVICES; POWER ELECTRONICS; PROBABILITY DENSITY FUNCTION; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR DEVICES; THRESHOLD VOLTAGE;

EID: 1542269365     PISSN: 15334678     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/LPE.2003.1231840     Document Type: Conference Paper
Times cited : (90)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.