Prediction of logic product failure due to thin-gate oxide breakdown

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2006, Pages 18-28

  Lee, Yung Huei ^a   Mielke, Neal ^a   Agostinelli, Marty ^a   Gupta, Sukirti ^a   Lu, Ryan ^a   McMahon, William ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC PRODUCT FAILURE; THIN-GATE OXIDE BREAKDOWN;

ELECTRIC BREAKDOWN; FAILURE ANALYSIS; MATHEMATICAL MODELS; OXIDE FILMS; RELIABILITY THEORY; TRANSISTORS;

LOGIC GATES;

EID: 34250742624     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2006.251187     Document Type: Conference Paper

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