Full-chip analysis of leakage power under process variations, including spatial correlations

Proceedings - Design Automation Conference

Volumn , Issue , 2005, Pages 523-528

  Chang, Hongliang ^a   Sapatnekar, Sachin S ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

Algorithm; Design; Performance; Reliability

Indexed keywords

APPROXIMATION THEORY; ELECTRON TUNNELING; LEAKAGE CURRENTS; PARAMETER ESTIMATION;

INTRA-CHIP VARIATION; LEAKAGE POWER; PROCESS PARAMETERS;

MICROPROCESSOR CHIPS;

EID: 27944470947     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1065579.1065716     Document Type: Conference Paper

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