A scalable statistical static timing analyzer incorporating correlated non-Gaussian and Gaussian parameter variations

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 27, Issue 1, 2008, Pages 160-173

  Singh, Jaskirat ^b,c   Sapatnekar, Sachin S ^a,b  

^a IEEE   (United States)

^b University of Minnesota   (United States)

^c INTEL CORPORATION   (United States)

Author keywords

Design automation; Timing; Variational methods

Indexed keywords

DESIGN AUTOMATION; NON GAUSSIAN VARIABLES; VARIATIONAL METHODS;

ALGORITHMS; COMPUTER SIMULATION; INTEGRATED CIRCUITS; PARAMETER ESTIMATION; RANDOM PROCESSES; STATISTICAL METHODS;

GAUSSIAN DISTRIBUTION;

EID: 37249034691     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2007.907241     Document Type: Article

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