Parametric yield maximization using gate sizing based on efficient statistical power and delay gradient computation

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn 2005, Issue , 2005, Pages 1023-1028

  Chopra, Kaviraj ^a   Shah, Saumil ^a   Srivastava, Ashish ^a   Blaauw, David ^a   Sylvester, Dennis ^a  

^a University of Michigan   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; CORRELATION METHODS; INFORMATION RETRIEVAL; LEAKAGE CURRENTS; OPTIMIZATION; STATISTICAL METHODS;

DELAY GRADIENT COMPUTATION; GATE SIZING; PERFORMANCE VARIABILITY; STATISTICAL POWERS;

COMPUTER AIDED DESIGN;

EID: 33751414776     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2005.1560212     Document Type: Conference Paper

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