Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance

Proceedings - Design Automation Conference

Volumn , Issue , 2005, Pages 535-540

  Srivastava, Ashish ^a   Shah, Saumil ^a   Agarwal, Kanak ^a   Sylvester, Dennis ^a   Blaauw, David ^a   Director, Stephen ^a  

^a University of Michigan   (United States)

Author keywords

Correlation; Leakage; Variability; Yield

Indexed keywords

ELECTRIC POTENTIAL; LEAKAGE CURRENTS; PARAMETER ESTIMATION; PROCESS CONTROL;

CORRELATION; VARIABILITY; YIELD;

PROCESS ENGINEERING;

EID: 27944464454     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/dac.2005.193867     Document Type: Conference Paper

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