Electrical noise as a reliability indicator in electronic devices and components

IEE Proceedings: Circuits, Devices and Systems

Volumn 149, Issue 1, 2002, Pages 13-22

  Jones, B K ^a  

^a LANCASTER UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC PROPERTIES; ELECTROMIGRATION; ELECTRON DEVICES; INTEGRATED CIRCUITS; LEAKAGE CURRENTS; RELIABILITY; RESISTORS; STRESSES; THIN FILMS;

ELECTRICAL NOISE;

SPURIOUS SIGNAL NOISE;

EID: 0036477016     PISSN: 13502409     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cds:20020331     Document Type: Conference Paper

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