Noise analysis and noise reliability indicators of optoelectron coupled devices

Solid-State Electronics

Volumn 44, Issue 8, 2000, Pages 1495-1500

  Dai, Yisong ^a   Xu, Jiansheng ^a  

^a JILIN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EQUIVALENT CIRCUITS; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE;

NOISE RELIABILITY INDICATORS; OPTOELECTRON COUPLED DEVICES (OCD);

OPTOELECTRONIC DEVICES;

EID: 0033706459     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(00)00050-2     Document Type: Article

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