Low-frequency noise used as a lifetime test of LEDs

Semiconductor Science and Technology

Volumn 11, Issue 8, 1996, Pages 1133-1136

  Ursutiu, Doru ^a   Jones, Brian K ^b  

^a TRANSILVANIA UNIVERSITY OF BRASOV   (Romania)

^b LANCASTER UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; RELIABILITY; SEMICONDUCTOR DEVICE TESTING; SERVICE LIFE; SPURIOUS SIGNAL NOISE;

FORWARD BIAS CURRENT PULSES; LOW FREQUENCY NOISE;

LIGHT EMITTING DIODES;

EID: 0030206804     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/11/8/002     Document Type: Article

References (12)

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10. Kleinpenning T G M 1980 Physica 98 B+C 289-99
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12. Dai Y 1993 Microelectron. Reliab. 33 2207-15