Low frequency drain and gate noise measurements of pseudomorphic HEMTs

Proceedings of the International Conference on Noise in Physical Systems and 1/f Fluctuations

Volumn , Issue , 1997, Pages 78-81

  Conti, Paolo ^a   Lisanti, Vincenzo ^a  

^a CSELT   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; GATES (TRANSISTOR); IMPACT IONIZATION; SPURIOUS SIGNAL NOISE; VOLTAGE MEASUREMENT;

ELECTRON CHANNELS;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 0031295899     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)