Random telegraph signal: An atomic probe of the local current in field-effect transistors

Journal of Applied Physics

Volumn 83, Issue 3, 1998, Pages 1734-1741

  Mueller, H H ^a   Schulz, M ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001055578     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366892     Document Type: Article

References (9)

1. K. S. Ralls, W. J. Skocpol, L. D. Jackel, R. E. Howard, L. A. Fetter, R. W. Epworth, and D. M. Tennant, Phys. Rev. Lett. 52, 228 (1984).
2. M. J. Kirton and M. J. Uren, Adv. Phys. 38, 367 (1989).
3. M. J. Kirton, M. J. Uren, S. Collins, M. Schulz, A. Karmann, and K. Scheffer, Semicond. Sci. Technol. 4, 1116 (1989).
4. H. H. Mueller and M. Schulz, J. Appl. Phys. 75, 2970 (1994).
5. H. H. Mueller and M. Schulz, J. Mater. Sci. 6, 65 (1995).
6. H. H. Mueller and M. Schulz, J. Appl. Phys. 79, 4178 (1996).
7. J. Brews, J. Appl. Phys. 46, 2181 (1975).
8. C. Jacoboni and P. Lugli, in The Monte Carlo Method for Semiconductor Device Simulation, Series Computational Microelectronics, edited by S. Selberherr (Springer, New York, 1989), p. 231.
9. L. Prandtl, K. D. Oswatitsch, and K. Weighardt, in Strömungslehre, 7th ed. (Vieweg & Sohn, Braunschweig, 1969), p. 58.