Excess thermal-noise in the electrical breakdown of random resistor networks

European Physical Journal B

Volumn 12, Issue 1, 1999, Pages 61-65

  Pennetta, C ^a,b   Kiss, L B ^c   Gingl, Z ^d   Reggiani, L ^a,b  

^a UNIVERSITY OF SALENTO   (Italy)

^b INFM   (Italy)

^c UPPSALA UNIVERSITY   (Sweden)

^d UNIVERSITY OF SZEGED   (Hungary)

Author keywords

72.70.+m Noise processes and phenomena; 73.61. r Electrical properties of specific thin films and layer structures (multilayers, superlattices, quantum wells, wires, arid dots); 81.70.Cv Nondestructive testing: Ultrasonic testing, photoacoustic testing

Indexed keywords

EID: 0442279174     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1007/s100510050977     Document Type: Article

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