Analog circuit fault diagnosis based on noise measurement

Microelectronics Reliability

Volumn 39, Issue 8, 1999, Pages 1293-1298

  Dai, Yisong ^a   Xu, Jiansheng ^a  

^a JILIN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; ELECTRIC FILTERS; SPURIOUS SIGNAL NOISE;

ANALOG CIRCUIT FAULT DIAGNOSIS;

LINEAR NETWORK ANALYSIS;

EID: 0033321308     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(99)00029-3     Document Type: Article

References (17)

1. Liu R.W. Testing and diagnosis of analog circuits and system. 1991;Van Nostrand Reinhold, New York.
2. Lin P.M., Elecherif Y.S. Analog circuits fault dictionary - new approaches and implementation. Int. J. Circuit Theory and Appl. 13:1985;149-172.
3. Bander J.W., et al. A nonlinear L1 optimization algorithm for design modeling and diagnosis of network. IEEE Trans. CAS. 34:(2):1987;174-181.
4. Somayajula S.S., Sanchez-Sinencio E., Pineda de Gyvez J. Analog fault diagnosis based on ramping power supply current signature clusters. IEEE Trans. Circuits and Systems II: Analog and Digital Signal Processing. 43:(10):1996;703-712.
5. Jones B.K. Electrical noise as a measure of quality and reliability in electronic devices. Advances in Electronics and Electron Physics. 87:1993;205-257.
6. Vandamme L.K.J. Noise as a diagnostic tool for quality and reliability of electron devices. IEEE Trans. Electronics Devices. 41:1994;2176-2178.
7. Jevtic M.M. Noise as a diagnostic and predication tool in reliability physics. Microelectron. Reliab. 35:(3):1995;455-477.
8. Tsong-Ming Chen, Abdullab M. Yassine. Electrical noise and VLSI interconnect reliability. IEEE Trans. Electron Devices. 41:(11):1994;2165-2172.
9. Jones B.K., Xu Y.Z. Excess noise as an indicator of digital integrated circuit reliability. Microelectron. Reliab. 31:(2/3):1991;351-361.
10. Ursutiu D., Jones B.K. Low frequency noise used as a lifetime test of LEDs. Semicond. Sci. Technol. 11:1996;1133-1136.
11. Zeynep Celik-Butler. Prediction of electromigation failure in W/Al-Cu multilayered metallizations by 1/f noise measurements. Solid-State Electronics. 35:(9):1992;1209-1212.
12. Vossen J.L. Screening of metal film defects by current noise measurements. Appl. Phys. Lett. 23:(4):1973;287-289.
13. Yisong Dai. A dynamic noise measurement technique used to estimate activation energies for failure mechanisms of a transistor. Microelectron. Reliab. 33:(15):1993;2207-2215.
14. Motchenbacher C.D., Fitchen F.C. Low-noise electronic design. 1973;Wiley, New York.
15. 9999 Dai. Noise performance analysis of bipolar operational amplifier based on the noise matrix superposition expression. IEE Proc-Circuits Devices Syst. 145:(5):1998;343-348.
16. Yisong Dai, Zhihong Quin, Yaqin Li. The noise matrix theory of two-port network. Chinese Sci. Bull. 42:(19):1997;1665-1669.
17. Yisong Dai. A precision noise measurement and analysis method used to estimate activation energies for failure mechanisms of a transistor. Microelectron. Reliab. 33:(15):1997;2207-2215.