A percolative approach to electromigration in metallic lines

Journal of Physics D: Applied Physics

Volumn 34, Issue 9, 2001, Pages 1421-1429

  Pennetta, C ^a   Reggiani, L ^a   Trefán, Gy ^a   Fantini, F ^b   Scorzoni, A ^c   De Munari, I ^d  

^a UNIVERSITY OF SALENTO   (Italy)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^c UNIVERSITY OF PERUGIA   (Italy)

^d UNIVERSITY OF PARMA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; COMPUTER SIMULATION; ELECTRIC BREAKDOWN; ELECTRIC RESISTANCE; ELECTROMIGRATION; MATHEMATICAL MODELS; MONTE CARLO METHODS; RANDOM PROCESSES; RESISTORS;

METALLIC INTERCONNECTS;

INTERMETALLICS;

EID: 0035821003     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/34/9/321     Document Type: Article

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