Low-frequency noise of thick-film resistors as quality and reliability indicator

Microelectronics Reliability

Volumn 41, Issue 4, 2001, Pages 531-542

  Rocak, Dubravka ^a   Belavic, Darko ^b   Hrovat, Marko ^a   Sikula, Josef ^c   Koktavy, Pavel ^c   Pavelka, Jan ^c   Sedlakova, Vlasta ^c  

^a JO EF STEFAN INSTITUTE   (Slovenia)

^b HIPOT HYB   (Slovenia)

^c BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; OPTICAL CORRELATION; RESISTORS; SPECTROSCOPY; SPURIOUS SIGNAL NOISE;

THICK-FILM RESISTORS;

THICK FILM DEVICES;

EID: 0035310720     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(00)00255-9     Document Type: Article

References (13)

1. Contact noise in thick film resistors
2. Current and noise measurements on low temperature thick film resistors (LTTFR)
3. Microstructural, XRD and electrical characterization of some thick-film resistors
4. Aging mechanisms and stability in thick film resistors
5. New resistor systems for hybrid circuits and resistive components
6. The influence of the dimensions of thick film resistors on long term stability, nonlinearity, and noise
7. Generation of 1/f noise spectrum by relaxation process in thin film resistors
8. Low frequency noise in film resistors
9. The effects of resistor geometry on current noise in thick-film resistors
10. Noise and non-linearity of thick film resistors
11. Silver-palladium thick-film conductors
12. Thick film resistor quality indicator based on noise index measurements
13. Analysis of the influence of conductor materials and processing parameters on thick film noise