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Volumn 428, Issue , 1996, Pages 141-146
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Establishing a quantitative relationship between harmonic signals and damage in interconnects
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CORRELATION METHODS;
ELECTRIC CURRENTS;
ELECTRIC RESISTANCE;
INTEGRATED CIRCUIT TESTING;
MATHEMATICAL MODELS;
SECOND HARMONIC GENERATION;
SEMICONDUCTING FILMS;
THERMAL NOISE;
THERMAL STRESS;
DIRECT CURRENT BIAS;
JOULE HEATING;
METAL INTERCONNECTS;
ELECTROMIGRATION;
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EID: 0030405355
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-428-141 Document Type: Conference Paper |
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Times cited : (2)
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References (7)
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