Thick-film resistor quality indicator based on noise index measurements

Microelectronics Journal

Volumn 30, Issue 12, 1999, Pages 1255-1259

  Jevtic M M ^a   Mrak, I ^b   Stanimirovic Z ^b  

^a UNIVERSITY OF BELGRADE   (Serbia)

^b Inst IRITEL   (Yugoslavia)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; CORRELATION METHODS; ELECTRIC RESISTANCE MEASUREMENT; SPURIOUS SIGNAL NOISE; THICK FILMS;

NOISE REDUCED MOBILITY; THICK FILM RESISTORS;

RESISTORS;

EID: 0033339214     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(99)00050-6     Document Type: Article

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