A precision noise measurement and analysis method used to estimate reliability of semiconductor devices

Microelectronics Reliability

Volumn 37, Issue 6, 1997, Pages 893-899

  Dai, Yisong ^a  

^a JUIN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CURVE FITTING; ELECTRIC POWER SUPPLIES TO APPARATUS; SEMICONDUCTOR DEVICES; SHOT NOISE; SIGNAL NOISE MEASUREMENT; SPECTRUM ANALYSIS; THERMAL NOISE;

PRECISION NOISE MEASUREMENT; ULTRA LOW NOISE AMPLIFIER;

RELIABILITY;

EID: 0031162467     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0026-2714(96)00117-5     Document Type: Article

References (15)

1. Folkes, P. A., Thermal noise measurements is GaAs MESFITs. IEEE Electron Devices Letters, 1985, EDL-6(12), 620-622.
2. 1-xAs. Solid State Electronics, 1988, 31(2), 279-282.
3. Dai, Yisong, Deep-level impurity analysis for p-n junction of a bipolar transistor from low-frequency g-r noise measurements. Solid State Electronics, 1989, 32(6), 439-443.
4. Neri, B., Pellegrini, B. and Saletti, R., Ultra low-noise preamplifier for low-frequency noise measurements in electron devices. IEEE Trans. on Instrum. Meas., 1991, IM-40(1), 2-6.
5. Macucci, M. and Pellegrini, B., Very sensitive measurement method of electron device current noise. IEEE Trans. on Instrum. Meas., 1991, IM-40(1), 7-12.
6. Brown, R. G., Introduction to Random Signal Analysis and Kalman Filtering. John Wiley, 1983, pp. 106-109.
7. van der Ziel, A., Noise: Sources, Characterization, Measurement. Prentice-Hall, Englewood Cliffs, NJ, 1970, p. 54.
8. Stor, L., Experimental techniques in noise measurement with special emphasis on precision measurement. Proc. 10th Int. Conf. on Noise in Physical Systems, ed. A. Ambrozy, Budapest, Hungary, 1989, pp. 551-560.
9. van Rheenen, A. D., Bosman, G., and Zijlstra, R. J. J., Low-frequency noise measurements as a tool to analyze deep-level impurities in semiconductor devices. Solid State Electronics, 1987, 30(3), 259-265.
10. Scholz, F., Hwang, J. M., and Schroder, D. K., Low frequency noise and DLTs as semiconductor device characterization tools. Solid State Electronics, 1988, 31(2), 205-217.
11. Vandamme, L. K. J., Alabedra, R., and Zommiti, M., 1/f noise used as a reliability estimation for solar cells. Solid State Electronics, 1983, 26, 671-674.
12. Vandamme, L. K. J. and Van Ruyen, L. J., 1/f noise used as a reliability test for diode lasers. Noise in Physical Systems and 1/f Noise ed. M. Savelli, G. Lecoy and J. P. Nougier. Elsevier Science Publishers, B.V., 1983.
13. Loreck, L., Dambkes, H., Ploog, K. and Weimann, G., Deep-level analysis in (AlGa)As-GaAs 2-D electron gas devices by means of low-frequency noise measurements. IEEE Electron Device Letters, 1984, EDL-5(1), 9-11.
14. Dai, Yisong, Performance analysis of cross-spectral density estimator and its applications. Int. J. Electronics, 1991, 71(1), 45-53.
15. Motchenbacher, C. D. and Fitchen, F. C., Low-Noise Electronic Design. Chapter 2. John Wiley, 1973.