Extended noise analysis - A novel tool for reliability screening

Microelectronics Reliability

Volumn 38, Issue 6-8, 1998, Pages 1193-1198

  Härtler, Gisela ^a   Golze, Ute ^a   Paschke, Katrin ^a  

^a LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; FREQUENCY DOMAIN ANALYSIS; RELIABILITY THEORY; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR LASERS; SIGNAL NOISE MEASUREMENT; SPECTRUM ANALYSIS; TIME DOMAIN ANALYSIS;

EXTENDED NOISE ANALYSIS; RELIABILITY SCREENING;

MICROELECTRONICS;

EID: 0032083818     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(98)00087-0     Document Type: Article

References (6)

1. Noise as a Diagnostic Tool for the Reliability Improvement of Microelectronic Components for Information Technology and Enviromental Control, NODITO Report, ed. C.Claeys, 1996
2. Yisong Dai et al., A study of optical noise measurement as a reliability estimation for laser diodes. Microelectron.Reliab. 35, 1995, pp 731-734
3. Härtler,G., Extended Noise Analysis, in: Noise in Physical Systems and 1/f Fluctuations, eds. C.Claeys, E.Simoen, Proc. of the 14th International Conference, 1997, World Scientific, pp 89-92
4. Lasota,A., Mackey,M.C., Chaos, Fractals, and Noise, Springer-Verlag, Applied Mathematical Sciences vol. 97, 1994
5. Hartler,G. et al., Transition Intensities and Noise Spectra in Submicron MOSFETs, in: Noise in Physical Systems and 1/f Fluctuations, eds. C.Claeys, E.Simoen, Proc. of the 14th International Conference, 1997, World Scientific, pp 224-227
6. Beister,G. et al., Nonradiative current in In-GaAs/AlGaAs laser diodes as a measure of facet stability, in press, 1998, Solid-State Electronics