Autocorrelation function of 1/f current fluctuations in vacuum microelectronics devices

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 3, 1996, Pages 2135-2137

  Amirkhanov, R N ^a   Ghots, S S ^a   Bakhtizin, R Z ^a  

^a Birsk Branch of Federal State Budgetary Educational Establishment of Higher Education Bashkir State University   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODES; CORRELATION METHODS; ELECTRIC CURRENTS; FUNCTIONS; SILICON WAFERS; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE; VACUUM TECHNOLOGY;

AUTOCORRELATION FUNCTION; CURRENT FLUCTUATIONS; SILICON FIELD EMITTER DEVICES; SPECTRAL DENSITY FUNCTION INDEX; VACUUM MICROELECTRONICS;

MICROELECTRONICS;

EID: 0030144916     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588886     Document Type: Article

References (9)

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