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12th International Conference on Microwaves and Radar, MIKON 1998
Volumn 1, Issue , 1998, Pages 79-83
LF noise and reliability of Gunn diodes
Author keywords

[No Author keywords available]
Indexed keywords

GUNN DIODES; MILITARY APPLICATIONS; RADAR; SEMICONDUCTOR DIODES;
EID: 0008969219     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MIKON.1998.737923     Document Type: Conference Paper
Times cited : (1)
References (5)
  • 1
    • 85051207994 scopus 로고
    • P: Rzyrzqdy plprzewodn. z efektem Gunna
    • B. G. Bosch,R. W. H. Engelmann P: Rzyrzqdy plprzewodn. z efektem Gunna, WNT 1980
    • (1980) WNT
    • Bosch, B.G.1    Engelmann, R.W.H.2
  • 2
    • 85051227840 scopus 로고
    • Mikrofalowe przyrzqdy psprzewodnikowe
    • J. Klamka: Mikrofalowe przyrzqdy psprzewodnikowe, WNT 1982
    • (1982) WNT
    • Klamka, J.1
  • 3
    • 85051239195 scopus 로고
    • Investigationo f Gunn diodes degradation mechanisms
    • Ksi@
    • A . M. Zaklikiewicz:Investigationo f Gunn diodes degradation mechanisms, Proc. of MIKON94 Conf. , Ksi@ 1994
    • (1994) Proc. of MIKON 94 Conf.
    • Zaklikiewicz, A.M.1
  • 4
    • 84962841723 scopus 로고
    • Zrodla szumow wp. p. iich wykorzystanie
    • 4. A. M. Zaklikiewicz:Zrodla szumow w p. p. i ich wykorzystanie, Prace ITE, 22,1995
    • (1995) Prace ITE , vol.22
    • Zaklikiewicz, A.M.1
  • 5
    • 0019367821 scopus 로고
    • Influencoe f burst noise on noise spectra
    • A. M. Zaklikiewicz:Influencoe f burst noise on noise spectra,Solid-St. El. ,1981,p. 1
    • (1981) Solid-St. El. , pp. 1
    • Zaklikiewicz, A.M.1

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.