Anomalous behaviour of the current noise in long-narrow-channel MOSFETS and its interpretation

Solid-State Electronics

Volumn 43, Issue 4, 1999, Pages 697-700

  Vandamme, L K J ^a   Kiss, L B ^b   Stoelinga, O L J ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; SEMICONDUCTOR DEVICE MODELS; SPURIOUS SIGNAL NOISE; THRESHOLD VOLTAGE; TRANSCONDUCTANCE;

CURRENT NOISE; FIXED DRAIN VOLTAGE; PARASITIC SOURCE SERIES RESISTANCE;

MOSFET DEVICES;

EID: 0032624605     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(98)00327-X     Document Type: Article

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