1/f noise in bismuth ruthenate based thick-film resistors

IEEE Transactions on Components Packaging and Manufacturing Technology Part A

Volumn 20, Issue 3, 1997, Pages 355-360

  Peled, Aaron ^a   Johanson, Robert E ^b   Zloof, Y ^b   Kasap, Safa O ^c,d  

^a HOLON INSTITUTE OF TECHNOLOGY   (Israel)

^b UNIVERSITY OF SASKATCHEWAN   (Canada)

^c Elta Electronics Industries Ltd   (Israel)

^d IEEE

Author keywords

1 f noise; Bismuth ruthenate; Thick film resistors

Indexed keywords

ACOUSTIC NOISE MEASUREMENT; ASPECT RATIO; SEMICONDUCTING BISMUTH COMPOUNDS; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE; THICK FILM DEVICES;

BISMUTH RUTHENATE; THICK FILM RESISTORS;

RESISTORS;

EID: 0031233167     PISSN: 10709886     EISSN: None     Source Type: Journal    
DOI: 10.1109/95.623030     Document Type: Article

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