Chromatic aberration correction: The next step in electron microscopy

Advances in Imaging and Electron Physics

Volumn 165, Issue C, 2011, Pages 73-130

  Leary, Rowan ^a,b   Brydson, Rik ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON LENSES; ELECTRON MICROSCOPES; ELECTRONS; HIGH RESOLUTION ELECTRON MICROSCOPY;

ABERRATION CORRECTION; CHROMATIC ABERRATION; CHROMATIC ABERRATION CORRECTION; ENERGY SPREADS; FUTURE TECHNOLOGIES; MULTIPLE IMAGE; OBJECTIVE LENS; ROTATIONAL SYMMETRIES;

ABERRATIONS;

EID: 79951500718     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/B978-0-12-385861-0.00003-8     Document Type: Chapter

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