Correction and alignment strategies for the beam separator of the photoemission electron microscope 3 (PEEM3)

Review of Scientific Instruments

Volumn 76, Issue 2, 2005, Pages

  Schmid, Peter ^a   Feng, Jun ^a   Padmore, Howard ^a   Robin, David ^a   Rose, Harald ^a   Schlueter, Ross ^a   Wan, Weishi ^a   Forest, Étienne ^b   Wu, Ying ^c  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

^c DUKE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMATIC ABERRATION; ELECTRON MIRRORS; GEOMETRIC ABERRATIONS; PHOTOEMISSION ELECTRON MICROSCOPE (PEEM);

ABERRATIONS; MIRRORS; PHOTOEMISSION; RANDOM ERRORS; SEPARATORS; SYNCHROTRON RADIATION; X RAY ANALYSIS;

ELECTRON MICROSCOPY;

EID: 13744251287     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1841871     Document Type: Review

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