Design of a microfabricated, two-electrode phase-contrast element suitable for electron microscopy

Ultramicroscopy

Volumn 107, Issue 4-5, 2007, Pages 329-339

  Cambie, Rossana ^a   Downing, Kenneth H ^a   Typke, Dieter ^a   Glaeser, Robert M ^a   Jin, Jian ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Phase contrast element

Indexed keywords

ELECTROSTATICS; FABRICATION; GROUNDING ELECTRODES; IMAGE ANALYSIS; LENSES; PHASE SHIFT;

CONCENTRIC GROUNDED ELECTRODES; ELECTROSTATIC CALCULATIONS; MICROFABRICATION; PHASE-CONTRAST ELEMENT;

SCANNING ELECTRON MICROSCOPY;

ARTICLE; ELECTRICITY; ELECTRODE; ELECTRON; ELECTRON BEAM; ELECTRON MICROSCOPE; ELECTRON MICROSCOPY; IMAGING; LENS; PHASE CONTRAST MICROSCOPY; SCANNING ELECTRON MICROSCOPE;

EID: 33846390605     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.09.001     Document Type: Article

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